AH276Z4-BE1 データシートの表示（PDF） - BCD Semiconductor

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AH276Z4-BE1

COMPLEMENTARY OUTPUT HALL EFFECT LATCH

BCD Semiconductor 

Data Sheet

COMPLEMENTARY OUTPUT HALL EFFECT LATCH

Absolute Maximum Ratings (Note 1)

(TA=25oC)

Parameter

Supply Voltage

Reverse Protection Voltage

Magnetic Flux Density

Output Current

Power Dissipation

Thermal Resistance

Continuous

Hold

Peak (start up)

Die to atmosphere

Die to package case

Symbol

VCC

VRCC

B

IO

PD

θJA

θJC

Storage Temperature

ESD (Machine Model)

ESD (Human Body Model)

TSTG

Value

20

-20

Unlimited

350

550

750

550

227

49

-50 to 150

300

2500

AH276

Unit

V

V

Gauss

mA

mA

mA

mW

oC/W

oC/W

oC

V

V

Note 1: Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device.

These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated

under "Recommended Operating Conditions" is not implied. "Absolute Maximum Ratings" for extended period may affect

device reliability.

Recommended Operating Conditions

(TA=25oC)

Parameter

Supply Voltage

Ambient Temperature

Symbol

Min

Max

Unit

VCC

3.5

16

V

TA

-20

85

oC

Nov. 2009 Rev. 1. 4

BCD Semiconductor Manufacturing Limited

4

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