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AH211Z4-A データシートの表示(PDF) - BCD Semiconductor

部品番号
コンポーネント説明
メーカー
AH211Z4-A
BCDSEMI
BCD Semiconductor BCDSEMI
AH211Z4-A Datasheet PDF : 11 Pages
1 2 3 4 5 6 7 8 9 10
Data Sheet
TWO PHASE HALL EFFECT LATCH WITH FG OUTPUT
Absolute Maximum Ratings (Note 1)
(TA=25oC)
Parameter
Supply Voltage
Magnetic Flux Density
Output Current
FG Current
Power Dissipation
Thermal Resistance
Continuous
Hold
Peak (start up)
Die to atmosphere
Die to package case
Symbol
VCC
B
IO
IFG
PD
θJA
θJC
Value
20
Unlimited
400
600
800
20
550
227
49
Storage Temperature
ESD (Machine Model)
ESD (Human Body Model)
TSTG
-50 to 150
300
3000
AH211
Unit
V
Gauss
mA
mA
mA
mA
mW
oC/W
oC/W
oC
V
V
Note 1: Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated
under "Recommended Operating Conditions" is not implied. "Absolute Maximum Ratings" for extended period may affect
device reliability.
Recommended Operating Conditions
(TA=25oC)
Parameter
Supply Voltage
Ambient Temperature
Symbol
Min
Max
Unit
VCC
3.5
16
V
TA
-20
85
oC
Mar. 2007 Rev. 1.3
BCD Semiconductor Manufacturing Limited
4

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