GT28F400B3B150 データシートの表示（PDF） - Intel

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GT28F400B3B150

SMART 3 ADVANCED BOOT BLOCK WORD-WIDE 4-MBIT (256K X 16), 8-MBIT (512K X 16), 16-MBIT (1024K X 16) FLASH MEMORY FAMILY

Intel 

E

SMART 3 ADVANCED BOOT BLOCK–WORD-WIDE

VCCQ

0.0

INPUT

VCCQ

2

TEST POINTS

VCCQ OUTPUT

2

0580_11

NOTE:

AC test inputs are driven at VCCQ for a logic “1” and 0.0V for a logic “0.” Input timing begins, and output timing ends, at VCCQ/2.

Input rise and fall times (10%–90%) <10 ns. Worst case speed conditions are when VCCQ = 2.7V.

Figure 11. 2.7V–3.6V Input Range and Measurement Points

Device

under

Test

VCCQ

R1

CL

R2

Test Configuration Component Values for Worst

Case Speed Conditions

Test Configuration

2.7V Standard Test

CL (pF) R1 (Ω) R2 (Ω)

50 25K 25K

NOTE:

CL includes jig capacitance.

Out

NOTE:

See table for component values.

Figure 12. Test Configuration

0580_12

PRELIMINARY

33

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