HEF4093B(2015) データシートの表示（PDF） - NXP Semiconductors.

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HEF4093B
(Rev.:2015)

Quad 2-input NAND Schmitt trigger

NXP Semiconductors. 

Nexperia

12. Waveforms

HEF4093B

Quad 2-input NAND Schmitt trigger

9,

LQSXW

9 

WU



90

W3+/

92+

RXWSXW

92/



90



W7+/

WI

W3/+

W7/+

DDJ

Fig 4.

Measurement points are given in Table 9.

Logic levels: VOL and VOH are typical output voltage levels that occur with the output load.

tr, tf = input rise and fall times.

Propagation delay and output transition time

Table 9. Measurement points

Supply voltage

VDD

5 V to 15 V

Input

VM

0.5VDD

Output

VM

0.5VDD

9''

9,

*

92

'87

57

&/

DDJ

Fig 5.

Test data given in Table 10.

Definitions for test circuit:

DUT = Device Under Test.

CL = load capacitance including jig and probe capacitance.

RT = termination resistance should be equal to the output impedance Zo of the pulse generator.

Test circuit for measuring switching times

Table 10. Test data

Supply voltage

VDD

5 V to 15 V

Input

VI

VSS or VDD

tr, tf

 20 ns

Load

CL

50 pF

HEF4093B

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 9 — 15 December 2015

© Nexperia B.V. 2017. All rights reserved

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