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SPT574BCS データシートの表示(PDF) - Cadeka Microcircuits LLC.

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SPT574BCS Datasheet PDF : 12 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
ELECTRICAL SPECIFICATIONS
TA = TMIN to TMAX, VEE = 0 to +5 V, VDD = +5 V, fS = 40 kHz, fIN = 10 kHz, unless otherwise specified.
PARAMETER
TEST
CONDITIONS
TEST
LEVEL
SPT574C
MIN TYP MAX
AC ELECTRICAL CHARACTERISTICS4
Stand-Alone Mode Timing
tHRL Low R/C Pulse Width
tDS STS Delay from R/C
tHDR Data Valid After R/C Low
tHS STS Delay After Data Valid
tHRH High R/C Pulse Width
tDDR Data Access Time
Sample-and-Hold
Aperture Delay
Aperture Uncertainty Time
VEE = +5 V
VEE = +5 V
VI
25
VI
200
VI
25
VI
300 400 1000
VI
100
VI
150
IV
20
V
300
SPT574B
MIN TYP MAX UNITS
25
ns
200 ns
25
ns
300 400 1000 ns
100
ns
150 ns
20
ns
300
ps, RMS
TEST LEVEL CODES
TEST LEVEL
All electrical characteristics are subject to the
I
following conditions:
II
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
III
cates the specific device testing actually per-
IV
formed during production and Quality Assur-
ance inspection. Any blank section in the data
V
column indicates that the specification is not
tested at the specified condition.
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA=25 °C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at TA = 25 °C. Parameter is
guaranteed over specified temperature range.
Figure 3 - Low Pulse for R/C - Outputs Enabled
After Conversion
t HRL
R/C
t DS
STS
t HDR
tC
t HS
DB11-DB0 DATA VALID
DATA VALID
Figure 4 - High Pulse for R/C - Outputs Enabled While
R/C is High, Otherwise High Impedance
R/C
t HRH
t DS
STS
t DDR
t HDR
HIGH-Z
DB11-DB0
DATA VALID
tC
HIGH-Z
SPT574
5
8/1/00

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