VNH3SP30 データシートの表示（PDF） - STMicroelectronics

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VNH3SP30

FULLY INTEGRATED H-BRIDGE MOTOR DRIVER

STMicroelectronics 

VNH3SP30

TEST MODE

The PWM pin allows to test the load connection between two half-bridges. In the test mode (Vpwm=-2V)

the internal Power Mos gate drivers are disabled. The INA or INB inputs allow to turn-on the High Side A

or B, respectively, in order to connect one side of the load at VCC voltage. The check of the voltage on

the other side of the load allow to verify the continuity of the load connection. In case of load

disconnection the DIADX/ENX pin corresponding to the faulty output is pulled down.

ELECTRICAL TRANSIENT REQUIREMENTS

ISO T/R

7637/1

Test Pulse

1

2

3a

3b

4

5

Test Level

I

-25V

+25V

-25V

+25V

-4V

+26.5V

Test Level

II

-50V

+50V

-50V

+50V

-5V

+46.5V

Test Level

III

-75V

+75V

-100V

+75V

-6V

+66.5V

Test Level

IV

-100V

+100V

-150V

+100V

-7V

+86.5V

Test Levels

Delays and Impedance

2ms, 10Ω

0.2ms, 10Ω

0.1µs, 50Ω

0.1µs, 50Ω

100ms, 0.01Ω

400ms, 2Ω

ISO T/R

7637/1

Test Pulse

1

2

3a

3b

4

5

Test Levels Result

I

C

C

C

C

C

C

Test Levels Result

II

C

C

C

C

C

E

Test Levels Result

III

C

C

C

C

C

E

Test Levels Result

IV

C

C

C

C

C

E

Class

C

E

Contents

All functions of the device are performed as designed after exposure to disturbance.

One or more functions of the device are not performed as designed after exposure to disturbance

and cannot be returned to proper operation without replacing the device.

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