NXP Semiconductors
74LVT273
3.3 V octal D-type flip-flop
VI 90 %
tW
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VM
tr
tf
VM
VCC
VI
PULSE
GENERATOR
VO
DUT
RT
CL
RL
001aaf615
Fig 9.
Test data is given in given in Table 9.
Definitions for test circuit:
RL = Load resistance;
CL = Load capacitance including jig and probe capacitance;
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
Load circuitry for switching times
Table 9.
Input
VI
2.7 V
Test data
Repetition rate
≤ 10 MHz
tW
500 ns
tr, tf
≤ 2.5 ns
Load
RL
500 Ω
CL
50 pF
74LVT273_3
Product data sheet
Rev. 03 — 10 September 2008
© NXP B.V. 2008. All rights reserved.
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