74LVT273D,118 データシートの表示（PDF） - NXP Semiconductors.
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74LVT273D,118 Datasheet PDF : 17 Pages
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NXP Semiconductors
74LVT273
3.3 V octal D-type flip-flop
6. Functional description
Table 3. Function selection
Inputs
MR
CP
Dn
L
X
X
H
↑
h
H
↑
l
H
L
X
Outputs
Qn
L
H
L
Q0
Operating mode
Reset (clear)
Load 1
Load 0
Retain state
[1] H = HIGH voltage level; h = HIGH voltage level one set-up time prior to the prior to the LOW-to-HIGH clock transition;
L = LOW voltage level; l = LOW voltage level one set-up time prior to the prior to the LOW-to-HIGH clock transition;
X = Don’t care; ↑ = LOW-to-HIGH clock transition; Q0 = output as it was.
7. Limiting values
Table 4. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to GND (ground = 0 V).
Symbol Parameter
Conditions
Min
Max
Unit
VCC
supply voltage
−0.5
+4.6
V
VI
input voltage
[1] −0.5
+7.0
V
VO
output voltage
Output in OFF or HIGH state
[1] −0.5
+7.0
V
IIK
input clamping current
VI < 0 V
−50
-
mA
IOK
output clamping current
VO < 0 V
−50
-
mA
IO
output current
output in LOW state
output in HIGH state
-
128
mA
−64
-
mA
Tstg
storage temperature
Tj
junction temperature
Ptot
total power dissipation
Tamb = −40 °C to +85 °C
−65
+150
°C
[2] -
150
°C
[3]
500
mW
[1] The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.
[2] The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability.
[3] For SO20 packages: above 70 °C derate linearly with 8 mW/K.
For SSOP20 and TSSOP20 packages: above 60 °C derate linearly with 5.5 mW/K.
For DHVQFN20 packages: above 60 °C derate linearly with 4.5 mW/K.
8. Recommended operating conditions
Table 5.
Symbol
VCC
VI
IOH
Recommended operating conditions
Parameter
Conditions
supply voltage
input voltage
HIGH-level output current
Min
Typ
Max
Unit
2.7
-
3.6
V
0
-
5.5
V
−32
-
-
mA
74LVT273_3
Product data sheet
Rev. 03 — 10 September 2008
© NXP B.V. 2008. All rights reserved.
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