M28C17-90K1T データシートの表示（PDF） - STMicroelectronics
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M28C17-90K1T Datasheet PDF : 17 Pages
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M28C17
Table 4. AC Measurement Conditions
Input Rise and Fall Times
Input Pulse Voltages
≤ 20ns
0.4V to 2.4V
Input and Output Timing Ref. Voltages 0.8V to 2.0V
Note that Output Hi-Z is defined as the point where data is no
longer driven.
Figure 7. AC Testing Input Output Waveforms
2.4V
0.4V
2.0V
0.8V
AI00826
Figure 8. AC Testing Equivalent Load Circuit
1.3V
1N914
DEVICE
UNDER
TEST
3.3kΩ
OUT
CL = 30pF
CL includes JIG capacitance
AI01129
Table 5. Capacitance (1) (TA = 25 °C, f = 1 MHz )
Symbol
Parameter
Test Condition
CIN
Input Capacitance
COUT
Output Capacitance
Note: 1. Sampled only, not 100% tested.
VIN = 0V
VOUT = 0V
Min
Max
Unit
6
pF
12
pF
Table 6. Read Mode DC Characteristics
(TA = 0 to 70°C or –40 to 85°C; VCC = 4.5V to 5.5V)
Symbol
Parameter
Test Condition
ILI
Input Leakage Current
ILO
Output Leakage Current
0V ≤ VIN ≤ VCC
0V ≤ VIN ≤ VCC
ICC (1)
ICC1 (1)
ICC2 (1)
Supply Current (TTL inputs)
Supply Current (CMOS inputs)
Supply Current (Standby) TTL
Supply Current (Standby) CMOS
E = VIL, G = VIL , f = 5 MHz
E = VIL, G = VIL , f = 5 MHz
E = VIH
E > VCC –0.3V
VIL
Input Low Voltage
VIH Input High Voltage
VOL Output Low Voltage
VOH Output High Voltage
Note: 1. All I/O’s open circuit.
IOL = 2.1 mA
IOH = –400 µA
Table 7. Power Up Timing (1) (TA = 0 to 70°C or –40 to 85°C)
Symbol
Parameter
tPUR
tPUW
Time Delay to Read Operation
Time Delay to Write Operation (once VCC ≥ 4.5V)
VWI
Write Inhibit Threshold
Note: 1. Sampled only, not 100% tested.
Min
– 0.3
2
2.4
Min
1
10
3.0
Max
Unit
10
µA
10
µA
30
mA
25
mA
1
mA
100
µA
0.8
V
VCC +0.5
V
0.4
V
V
Max
Unit
µs
ms
4.2
V
6/17
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