MCP3001 データシートの表示（PDF） - Microchip Technology
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MCP3001 Datasheet PDF : 28 Pages
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MCP3001
1.0 ELECTRICAL
CHARACTERISTICS
1.1 Maximum Ratings*
VDD......................................................................... 7.0V
All inputs and outputs w.r.t. VSS ...... -0.6V to VDD +0.6V
Storage temperature ..........................-65°C to +150°C
Ambient temp. with power applied .....-65°C to +125°C
ESD protection on all pins (HBM)........................> 4kV
*Notice: Stresses above those listed under “Maximum ratings”
may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at those or
any other conditions above those indicated in the operational
listings of this specification is not implied. Exposure to maxi-
mum rating conditions for extended periods may affect device
reliability.
PIN FUNCTION TABLE
Name
VDD
VSS
IN+
IN-
CLK
DOUT
CS/SHDN
VREF
Function
+2.7V to 5.5V Power Supply
Ground
Positive Analog Input
Negative Analog Input
Serial Clock
Serial Data Out
Chip Select/Shutdown Input
Reference Voltage Input
ELECTRICAL CHARACTERISTICS
All parameters apply at VDD = 5V, VSS = 0V, VREF = 5V, TAMB = -40°C to +85°C, fSAMPLE = 200 ksps and fCLK = 14*fSAMPLE,
unless otherwise noted. Typical values apply for VDD = 5V, TAMB =25°C, unless otherwise noted.
Parameter
Sym
Min
Typ
Max Units
Conditions
Conversion Rate:
Conversion Time
tCONV
—
—
10
clock
cycles
Analog Input Sample Time
tSAMPLE
1.5
clock
cycles
Throughput Rate
DC Accuracy:
fSAMPLE
—
—
200
ksps VDD = VREF = 5V
75
ksps VDD = VREF = 2.7V
Resolution
10
bits
Integral Nonlinearity
INL
—
±0.5
±1
LSB
Differential Nonlinearity
DNL
—
±0.25
±1
LSB No missing codes over tem-
perature
Offset Error
—
—
±1.5
LSB
Gain Error
—
—
±1
LSB
Dynamic Performance:
Total Harmonic Distortion
THD
—
-76
—
dB VIN = 0.1V to 4.9V@1 kHz
Signal to Noise and Distortion
SINAD
—
61
—
dB VIN = 0.1V to 4.9V@1 kHz
(SINAD)
Spurious Free Dynamic Range
SFDR
—
80
—
dB VIN = 0.1V to 4.9V@1 kHz
Reference Input:
Voltage Range
VREF
0.25
—
VDD
V Note 2
Current Drain
IREF
—
90
150
µA
0.001
3
µA CS = VDD = 5V
Note 1: This parameter is guaranteed by characterization and not 100% tested.
2: See graph that relates linearity performance to VREF level.
3: Because the sample cap will eventually lose charge, clock rates below 10 kHz can affect linearity perfor-
mance, especially at elevated temperatures.
DS21293C-page 2
© 2007 Microchip Technology Inc.
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