HCF4010 データシートの表示（PDF） - STMicroelectronics
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HCF4010 Datasheet PDF : 13 Pages
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HCF4010
Electrical characteristics
Symbol
Table 7. Dynamic electrical characteristics
(Tamb = 25 °C, CL = 50 pF, RL = 200 kΩ, tr = tf = 20 ns)
Parameter
Test condition
VDD (V)
VI (V) VCC (V)
Value(1)
Min. Typ. Max.
Unit
5
5
5
150
350
tTLH
Output transition time
10
10
10
15
15
15
75
15
55
110
5
5
5
35
70
tTHL
Output transition time
10
10
10
15
15
15
20
40
15
30
5
5
5
100
200
tPLH
Propagation delay time
10
10
10
10
10
5
15
15
15
50
100
ns
50
100
35
70
15
15
5
35
70
5
5
5
65
130
10
10
10
35
70
tPHL
Propagation delay time
10
10
5
15
15
15
30
70
25
50
15
15
5
20
40
1. Typical temperature coefficient for all VDD values is 0.3%/°C.
Figure 3. Test circuit
1. CL = 50 pF or equivalent (includes jig and probe capacitance).
2. RL = 200 kΩ.
3. RT = ZOUT of pulse generator (typically 50 Ω).
DocID8190 Rev 8
7/13
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