10020EV8 データシートの表示（PDF） - Philips Electronics
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10020EV8 Datasheet PDF : 17 Pages
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Philips Semiconductors Programmable Logic Devices
ECL programmable array logic
Product specification
10H20EV8/10020EV8
DC ELECTRICAL CHARACTERISTICS 10H20EV8
0°C ≤ Tamb ≤ +75°C, VEE = –5.2V ± 5%, VCC = VCO1 = VCO2 = GND
SYMBOL
PARAMETER1
VOH
High level output voltage
TEST CONDITIONS2
VIN = VIH MIN or VIL MAX
VOL
Low level output voltage
VIN = VIH MIN or VIL MAX
IIH
High level input current
IIL
Low level input current
–IEE
Supply current
VIN = VIH MAX
VIN = VIL MIN
Except I/O Pins
VEE = MAX
All inputs = VIH MAX
Tamb
0°C
+25°C
+75°C
0°C
+25°C
+75°C
0°C
+75°C
0°C
+75°C
0°C to +75°C
LIMITS4
MIN MAX
–1020
–980
–920
–840
–810
–735
–1950
–1950
–1950
–1630
–1630
–1600
UNITS
mV
mV
220
µA
0.3
µA
250
mA
DC ELECTRICAL CHARACTERISTICS 10020EV8
0°C ≤ Tamb ≤ +85°C, –4.8V ≤ VEE ≤ –4.2V, VCC = VCO1 = VCO2 = GND
LIMITS4
SYMBOL
PARAMETER1
TEST CONDITIONS2
MIN TYP MAX UNITS
VEE = –4.2V –1020
–870 mV
VOH
High level output voltage
VIN = VIH MAX or VIL MIN VEE = –4.5V –1025 –955 –880 mV
VEE = –4.8V –1035
–880 mV
Outputs Apply VIHMIN or VILMAX to VEE = –4.2V –1030
mV
VOHT High level output threshold voltage Loaded one input at a time, other VEE = –4.5V –1035
mV
with 50Ω inuts at VIHMAX or VILMIN. VEE = –4.8V –1045
mV
to –2.0V Apply VIHMIN or VILMAX to VEE = –4.2V
–1595 mV
VOLT
Low level output threshold voltage ± 0.010V one input at a time, other VEE = –4.5V
–1610 mV
inuts at VIHMAX or VILMIN. VEE = –4.8V
–1610 mV
VEE = –4.2V –1810
–1605 mV
VOL
Low level output voltage
Inuts at VIHMAX or VILMIN. VEE = –4.5V –1810 –1705 –1620 mV
VEE = –4.8V –1830
–1620 mV
IIH
High level input current
One input under test at VIHMAX. Other inputs at
VILMIN.
220
µA
IIL
Low level input current
One input under test at VILMIN. Other inputs at
0.5
µA
VIHMAX.
–IEE
VEE supply current
All inputs at VIHMAX.
230 mA
NOTES:
1. All voltage measurements are referenced to the ground terminal.
2. Each ECL 10KH/100K series device has been designed to meet the DC specification after thermal equilibrium has been established.
Thermal equilibrium is established by applying power for at least 2 minutes, while maintaining transverse airflow of 2.5 meters/sec (500
linear feet/min.) over the device, mounted either in a test socket or on a printed circuit board. Test voltage values are given in the DC
operating conditions table. Conditions for testing shown in the tables are not necessarily worst case. For worst case testing guidelines, refer
to DC Testing, Chapter 1, Section 3, of the Philips Semiconductors 10/100K ECL Data Handbook.
3. Terminals not specifically referenced can be left electrically open. Open inputs assume a logic LOW state. Any unused pins can be
terminated to –2V. If tied to VEE, it must be through a resistor > 10K. It is recommended that pins that have been programmed as RESET,
PRESET, or CLOCK inputs not be left open due to the possibility of false triggering from internally and externally generated switching
transients.
4. The specified limits represent the worst case values for the parameter. Since these worst case values normally occur at the supply voltage
and temperature extremes, additional noise immunity can be achieved by decreasing the allowable operating condition ranges.
October 22, 1993
118
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