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10020EV8 データシートの表示(PDF) - Philips Electronics

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10020EV8
Philips
Philips Electronics Philips
10020EV8 Datasheet PDF : 17 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Philips Semiconductors Programmable Logic Devices
ECL programmable array logic
AC TEST CIRCUIT
+2.0V + 0.010V
25µF
0.1µF
Product specification
10H20EV8/10020EV8
L1
PULSE
GENERATOR
SCOPE
RT
L3
VCO1 VCC VCO2
I1
FX
I11
DUT
CLK/I12
FM
FY
FN
VEE
25µF
0.01µF
L2
SCOPE
CL
RT
–2.5V + 0.010V FOR 10020EV8
–3.2V + 0.010V FOR 10H20EV8
NOTES:
1. Use decoupling capacitors of 0.1µF and 25µF from GND to VCC, and 0.01µF and 25µF from GND to VEE (0.01 and 0.1µF capacitors
should be NPO Ceramic or MLC type). Decoupling capacitors should be placed as close as physically possible to the DUT and lead
length should be kept to less than 1/4 inch (6mm).
2. All unused inputs should be connected to either HIGH or LOW state consistent with the LOGIC function required.
3. All unused outputs are loaded with 50to GND.
4. L1 and L2 are equal length 50impedance lines. L3, the distance from the DUT pin to the junction of the cable from the Pulse
Generator and the cable to the Scope, should not exceed 1/4 inch (6mm).
5. RT = 50terminator internal to Scope.
6. The unmatched wire stub between coaxial cable and pins under test must be less than 1/4 inch (6mm) long for proper test.
7. CL = Fixture and stray capacitance 3pF.
8. Any unterminated stubs connected anywhere along the transmission line between the Pulse Generator and the DUT or between the
DUT and the Scope should not exceed 1/4 inch (6mm) in length (refer to section on AC setup procedure).
9. All 50resistors should have tolerance of ± 1% or better.
10. Test procedures are shown for only one input or set of input conditions. Other inputs are tested in the same manner.
October 22, 1993
121

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