CXA3541N データシートの表示（PDF） - Sony Semiconductor

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CXA3541N

2-channel Read/Write Amplifier for GMR-Ind Head Hard Disk Drive

Sony Semiconductor 

CXA3541N

Unsafe Condition

1. Write fault condition

FLT is a high level in write fault condition.

• Open write head leads. fWD < 15MHz

• Write head leads shorted to ground.

• WD frequency is too low.

• Power supply is out of tolerance.

2. Read fault condition

FLT is a low level in read fault condition.

• Open short MR head. (This function is set by serial resister.)

Bank Write Control (Refer to Bank "Write current vs. Current accuracy" characteristic curve)

1. Set the read mode.

2. Force a certain voltage (min. VCC + 1.2V) to FLT/SE pin by using the pull-up register. (RSE = 820Ω)

#This operation disables all fault detection.

3. Set VCC at 3.5V (in case of the erase mode only)

4. Start the write operation by setting R/XW = L.

5. Terminate the write operation by setting R/XW = H.

i) Allow 50% write duty or less.

ii) Low voltage detector is disabled in the bank write mode and erase mode.

iii) Don't change the serial register data bits in following conditions:

• VCC = 3.5V

• On entering write data.

BHV (Buffered Head Voltage)

1. Applicable within VCC = 5V ± 5%.

2. Turn BHV on, but turn off MROPN and MRSHT.

3. VBHV is determined by basis of VCC. VBHV = VCC – (4 × IB × (RMR + 5.5Ω))

Head Condition

1. Short X-Y terminal on un-used write head.

2. Recommended X-Y terminal on un-used read head short.

Polarity

1. Read output signal on RDX is negative, when MRX is positive by increasing RMR.

2. Write current flows into X side, when WDX is high and WDY is low.

Head Select Table

(2ch)

HS

Normal operation

0

0

1

1

– 11 –

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