CXA3541N データシートの表示（PDF） - Sony Semiconductor
部品番号
コンポーネント説明
メーカー
CXA3541N Datasheet PDF : 17 Pages
| |||
CXA3541N
No.
Item
Symbol
Measurement conditions
Min.
Read Characteristics RMR = 50Ω, IB = 5.9mA
R1 Low gain
AVL
Gain = 0
RMR = 50Ω, IB = 5.9mA
82
R2 High gain
AVH
Gain = 1
RMR = 50Ω, IB = 5.9mA
110
R3
Low frequency cut-off
(–3dB)
FCL
R4
High frequency cut-off
(–3dB)
FCH
140
R5 Input reflected noise
ENi
Exclusive of head noise
RMR = 50Ω, IB = 5.9mA
R6 MR bias current range 1 IBR1
3
R7 MR bias accuracy
EIB
–7
R8 MR bias resolution
RIB
3-bit DAC
R9-1
VCC power supply
rejection ratio
PSRR1
Ripple voltage: 100mVp-p
100kHz to 50MHz
38
R9-2
VEE power supply
rejection ratio
PSRR2
Ripple voltage: 100mVp-p
100kHz to 10MHz
45
R10-1
Common mode
rejection ratio 1
CMRR1
Ripple voltage: 100mVp-p
100kHz to 50MHz
37
R10-2
Common mode
rejection ratio 2
CMRR2
Ripple voltage: 100mVp-p
51MHz to 80MHz
27
R11
Control line input noise
rejection
CLRR
Ripple voltage: 100mVp-p
4MHz to 80MHz
40
R12
RDX/RDY offset
difference magnitude
VOFF1
Write to read
R13
RDX/RDY output
impedance
RDro Differential, read mode
30
Read Safety Characteristics
P1 MR head open threshold MRop Head X – Head Y
600
P2 MR head short threshold MRsh
Head X – Head Y
IB = "000" to "011"
15
Write Characteristics
W1 Write current range
IWR
DAC code = x "0000" to x "1111" 19.5
W2 Write current accuracy EIW
RH = 0Ω
–7
W3 Write current resolution RIW
4-bit DAC
W4 Leakage current
ILEAK
Unselected head
W6 Damping resistor
RD
800
W7
Write current propagation
delay time
Tpd
LH = 0, RH = 0
Write data to 50% of write current
W8 Write current rise/fall time TR/TF RH = 15Ω, LH = 150nH, IW = 25mA
W9 Erase current accuracy EIE
VCC = 3.5V
DAC code = x "0101"
–18
W10
Bank write current
accuracy
Refer to Fig.
–7–
Typ. Max.
100 118
135 160
350 550
200
0.77 0.95
8
+7
0.714
50
100
750 900
50 90
2
1000
49.5
+7
200
1200
10
1.9
–9 0
Unit
V/V
V/V
kHz
MHz
nV
√ Hz
mA
%
mA
dB
dB
dB
dB
dB
mV
Ω
mV
mV
mA
%
mA
µA
Ω
ns
ns
%
Share Link: 