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1PMT4135(2013) データシートの表示(PDF) - Microsemi Corporation

部品番号
コンポーネント説明
メーカー
1PMT4135
(Rev.:2013)
Microsemi
Microsemi Corporation Microsemi
1PMT4135 Datasheet PDF : 5 Pages
1 2 3 4 5
GRAPHS
1PMT4614e3 – 1PMT4627e3,
1PMT4099e3 – 1PMT4135e3
FIGURE 1 – Noise Density Measurement Circuit
Noise density, (ND) is specified in microvolt-rms per
square-root-hertz. Actual measurement is performed
using a 1 kHz to 3 kHz frequency bandpass filter at a
constant Zener test current (IZT ) at 25 oC ambient
temperature. ND is calculated from the formula.
Temperature (oC)
FIGURE 2 - Power Derating Curve
Where TC is case (bottom) temperature and
TA is Ambient Temperature on FR4 PC board.
RF01097, Rev. A (2/21/13)
Zener Voltage VZ
FIGURE 3 – Capacitance vs. Zener Voltage (Typical)
©2013 Microsemi Corporation
Page 4 of 5

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