HD74UH00 データシートの表示（PDF） - Hitachi -> Renesas Electronics

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HD74UH00

2-input NAND Gate

Hitachi -> Renesas Electronics 

HD74UH00

Ta = 25°C

Ta = –40 to

85°C

Test Conditions

Item

Output rise/fall time

Symbol Min Typ Max Min Max Unit VCC

t TLH

— 50 125 — 155 ns 2.0

t THL

— 14 25 — 31

4.5

— 12 21 — 26

6.0

See under figure

Propagation delay time tPLH

t PHL

— 48 100 — 125 ns 2.0

— 12 20 — 25

4.5

— 9 17 — 21

6.0

See under figure

Input capacitance

CIN

— 5 10 — 10 pF —

Equivalent capacitance CPD

— 10 — — —

—

(CL = 50 pF, tr = tf = 6 ns)

Note: CPD is equivalent capacitance inside of the IC calculated from the operating current without load (see

test circuit). The average operating current without load is calculated according to the expression

below.

ICC(opr) = CPD• VCC• fIN + ICC

Test Circuit

VCC

Pulse

generator

Input

50 Ω

Note: Operating current test time, output is open.

Output

CL

4

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