A3260LUA データシートの表示（PDF） - Allegro MicroSystems

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A3260LUA

2-WIRE, CHOPPER-STABILIZED, PRECISION HALL-EFFECT BIPOLAR SWITCH

Allegro MicroSystems 

3260

2-WIRE, CHOPPER-STABILIZED,

PRECISION HALL-EFFECT

BIPOLAR SWITCH

CRITERIA FOR DEVICE QUALIFICATION

All Allegro sensors are subjected to stringent qualification requirements prior to being released to production.

To become qualified, except for the destructive ESD tests, no failures are permitted.

Qualification Test

Test Method and Test Conditions

Biased Humidity (HAST) TA = 130°C, RH = 85%

High-Temperature

Operating Life (HTOL)

Accelerated HTOL

JESD22-A108,

TA = 150°C, TJ ≤ 165°C

TA = 175°C, TJ = 190°C

Autoclave, Unbiased

High-Temperature

(Bake) Storage Life

Temperature Cycle

Latch-Up

JESD22-A102, Condition C,

TA = 121°C, 15 psig

MIL-STD-883, Method 1008,

TA = 170°C

MIL-STD-883, Method 1010,

-65°C to +150°C

—

Electro-Thermally

Induced Gate Leakage

ESD,

Human Body Model

Electrical Distributions

—

CDF-AEC-Q100-002

Per Specification

Test Length Samples

50 hrs

77

408 hrs

77

504 hrs

77

96 hrs

77

1000 hrs

77

500 cycles

77

Pre/Post

Reading

Pre/Post

Reading

Pre/Post

Reading

—

6

6

x per

test

30

Comments

VCC = VOUT = 5 V

VCC = 24 V,

VOUT = 20 V

VCC = 24 V,

VOUT = 20 V

Test to failure,

All leads > TBD

115 Northeast Cutoff, Box 15036

6

Worcester, Massachusetts 01615-0036 (508) 853-5000

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