A3361EEUA-TL データシートの表示（PDF） - Allegro MicroSystems

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A3361EEUA-TL

2-WIRE, CHOPPER-STABILIZED, HALL-EFFECT SWITCHES

Allegro MicroSystems 

3361 AND 3362

2-WIRE,

CHOPPER-STABILIZED,

HALL-EFFECT SWITCHES

CRITERIA FOR DEVICE QUALIFICATION

All Allegro sensors are subjected to stringent qualification requirements prior to being released to production.

To become qualified, except for the destructive ESD tests, no failures are permitted.

Qualification Test

Test Method and Test Conditions

Biased Humidity (HAST) TA = 130°C, RH = 85%

High-Temperature

Operating Life (HTOL)

JESD22-A108,

TA = 150°C, TJ = 165°C

Accelerated HTOL

JESD22-A108,

TA = 175°C, TJ = 190°C

Autoclave, Unbiased

JESD22-A102, Condition C,

TA = 121°C, 15 psig

High-Temperature

(Bake) Storage Life

MIL-STD-883, Method 1008,

TA = 170°C

Temperature Cycle

MIL-STD-883, Method 1010,

-65°C to +150°C

Latch-Up

—

Electro-Thermally

Induced Gate Leakage

ESD,

Human Body Model

Electrical Distributions

—

CDF-AEC-Q100-002

Per Specification

Test Length Samples

50 hrs

77

408 hrs

77

504 hrs

77

96 hrs

77

1000 hrs

77

500 cycles

77

Pre/Post

Reading

Pre/Post

Reading

Pre/Post

Reading

—

6

6

x per

test

30

Comments

VCC = VOUT = 5 V

VCC = 24 V,

VOUT = 20 V

VCC = 24 V,

VOUT = 20 V

Test to failure,

All leads > TBD

115 Northeast Cutoff, Box 15036

6

Worcester, Massachusetts 01615-0036 (508) 853-5000

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