Philips Semiconductors
SI2302DS
N-channel enhancement mode field-effect transistor
8. Characteristics
Table 5: Characteristics
Tj = 25 °C unless otherwise specified
Symbol Parameter
Conditions
Static characteristics
V(BR)DSS drain-source breakdown voltage
VGS(th) gate-source threshold voltage
IDSS
drain-source leakage current
IGSS
RDSon
gate-source leakage current
drain-source on-state resistance
Dynamic characteristics
ID = 10 µA; VGS = 0 V
ID = 1 mA; VDS = VGS; Figure 9
VDS = 20 V; VGS = 0 V
Tj = 25 °C
Tj = 55 °C
VGS = ±8 V; VDS = 0 V
VGS = 4.5 V; ID = 3.6 A; Figure 7 and 8
VGS = 2.5 V; ID = 3.1 A; Figure 7 and 8
gfs
forward transconductance
Qg(tot) total gate charge
Qgs
gate-source charge
Qgd
gate-drain (Miller) charge
Ciss
input capacitance
Coss
output capacitance
Crss
reverse transfer capacitance
td(on)
turn-on delay time
tr
rise time
td(off)
turn-off delay time
tf
fall time
Source-drain diode
VDS = 5 V; ID = 3.6 A
VDD = 10 V; VGS = 4.5 V; ID = 3.6 A; Figure 13
VGS = 0 V; VDS = 10 V; f = 1 MHz; Figure 11
VDD = 10 V; RL = 5.5 Ω; VGS = 4.5 V; RG = 6 Ω
VSD
source-drain (diode forward) voltage IS = 1.6 A; VGS = 0 V; Figure 12
Min Typ Max Unit
20 − − V
0.65 − − V
− 0.01 1.0 µA
− − 10 µA
− 10 100 nA
− 56 85 mΩ
− 77 115 mΩ
−8−S
− 5.4 10 nC
− 0.65 − nC
− 1.6 − nC
− 230 − pF
− 125 − pF
− 80 − pF
− 12 20 ns
− 23 35 ns
− 50 100 ns
− 34 50 ns
− 0.8 1.2 V
9397 750 09107
Product data
Rev. 02 — 20 November 2001
© Koninklijke Philips Electronics N.V. 2001. All rights reserved.
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