3D7418-1 データシートの表示（PDF） - Data Delay Devices

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3D7418-1

MONOLITHIC 8-BIT PROGRAMMABLE DELAY LINE (SERIES 3D7418 – LOW NOISE)

Data Delay Devices 

3D7418

SILICON DELAY LINE AUTOMATED TESTING

TEST CONDITIONS

INPUT:

Ambient Temperature: 25oC ± 3oC

Supply Voltage (Vcc): 5.0V ± 0.1V

Input Pulse:

High = 3.0V ± 0.1V

Low = 0.0V ± 0.1V

Source Impedance: 50Ω Max.

Rise/Fall Time:

3.0 ns Max. (measured

between 0.6V and 2.4V )

Pulse Width:

Period:

PWIN = 1.25 x Total Delay

PERIN = 2.5 x Total Delay

OUTPUT:

Rload:

Cload:

Threshold:

10KΩ ± 10%

5pf ± 10%

1.5V (Rising & Falling)

Device

Under

Test

10KΩ

470Ω

Digital

Scope

5pf

NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.

COMPUTER

SYSTEM

PRINTER

PULSE

GENERATOR

OUT

TRIG

IN DEVICE UNDER

TEST (DUT)

REF

OUT IN

DIGITAL SCOPE/

TRIG TIME INTERVAL COUNTER

Figure 6: Test Setup

tRISE

PWIN

PERIN

tFALL

INPUT

2.4V

VIH

2.4V

SIGNAL

1.5V

0.6V

1.5V

0.6V

VIL

tPLH

tPHL

OUTPUT

SIGNAL

1.5V

VOH

1.5V

VOL

Figure 7: Timing Diagram

Doc #02005

DATA DELAY DEVICES, INC.

7

6/17/02

3 Mt. Prospect Ave. Clifton, NJ 07013

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