3D7428-1.5 データシートの表示（PDF） - Data Delay Devices
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3D7428-1.5 Datasheet PDF : 7 Pages
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SILICON DELAY LINE AUTOMATED TESTING
3D7428
TEST CONDITIONS
INPUT:
Ambient Temperature: 25oC ± 3oC
Supply Voltage (Vcc): 5.0V ± 0.1V
Input Pulse:
High = 3.0V ± 0.1V
Low = 0.0V ± 0.1V
Source Impedance: 50Ω Max.
Rise/Fall Time:
3.0 ns Max. (measured
between 0.6V and 2.4V )
Pulse Width:
Period:
PWIN = 1.25 x Total Delay
PERIN = 2.5 x Total Delay
OUTPUT:
Rload:
Cload:
Threshold:
10KΩ ± 10%
5pf ± 10%
1.5V (Rising & Falling)
Device
Under
Test
10KΩ
470Ω
Digital
Scope
5pf
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.
COMPUTER
SYSTEM
PRINTER
PULSE
GENERATOR
OUT
TRIG
IN DEVICE UNDER
TEST (DUT)
OUT
REF
IN
DIGITAL SCOPE/
TRIG TIME INTERVAL COUNTER
Figure 6: Test Setup
tRISE
PWIN
PERIN
tFALL
INPUT
2.4
VIH
2.4
SIGNAL
1.5
0.6
1.5
0.6
VIL
tPLH
tPHL
OUTPUT
SIGNAL
VOH
1.5
1.5
VOL
Figure 7: Timing Diagram
Doc #03003
DATA DELAY DEVICES, INC.
7
5/8/2006
3 Mt. Prospect Ave. Clifton, NJ 07013
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