56F8355 データシートの表示（PDF） - Freescale Semiconductor

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56F8355

16-Bit Digital Signal Controllers

Freescale Semiconductor 

Version History

Rev 0.0

Rev 1.0

Rev 2.0

Rev 3.0

Rev 4.0

Rev 5.0

Rev 6.0

Rev 7.0

Rev 8.0

Rev 9.0

Rev 10.0

Rev 11.0

Rev. 12

Document Revision History

Description of Change

Initial release

Fixed typos in Section 1.1.3; Replace any reference to Flash Interface Unit with Flash

Memory Module; added note to Vcap pin in Table 2-2; corrected Table 4-4, removed

unneccessary notes in Table 10-12; corrected temperature range in Table 10-14; added

ADC calibration information to Table 10-23 and new graphs in Figure 10-22

Corrected 2.2μF to 0.1 μF low ESR capacitor in Table 2-2. Replaced Table 10-16 with

correct parameters for the 128 package pinout. Corrected (fout/2) with (fout) in Table 10-14.

Corrected pinout labels in Figure 11-1.

Adding/clarifing notes to Table 4-4 to help clarify independent program flash blocks and

other Program Flash modes, clarification to Table 10-22, corrected Digital Input Current Low

(pullup enabled) numbers in Table 10-5. Removed text and Table 10-2; replaced with note to

Table 10-1.

Correcting Table 4-6 Address locations.

Added 56F8155 information; edited to indicate differences in 56F8355 and 56F8155. Refor-

matted for Freescale look and feel. Updated Temperature Sensor and ADC tables, then

updated balance of electrical tables for consistency throughout the family. Clarified I/O power

description in Table 2-2, added note to Table 10-7 and clarified Section 12.3.

Added output voltage maximum value and note to clarify in Table 10-1; also removed overall

life expectancy note, since life expectancy is dependent on customer usage and must be

determined by reliability engineering. Clarified value and unit measure for Maximum allowed

PD in Table 10-3. Corrected note about average value for Flash Data Retention in

Table 10-4. Added new RoHS-compliant orderable part numbers in Table 13-1.

Updated Table 10-23 to reflect new value for maximum Uncalibrated Gain Error

Deleted RSTO from Pin Group 2 (listed after Table 10-1). Deleted formula for Max Ambient

Operating Temperature (Automotive) and Max Ambient Operating Temperature (Industrial)

in Table 10-4. Added RoHS-compliance and “pb-free” language to back cover.

Added information/corrected state during reset in Table 2-2. Clarified external reference

crystal frequency for PLL in Table 10-14 by increasing maximum value to 8.4MHz.

Replaced “Tri-stated” with an explanation in State During Reset column in Table 2-2.

Corrected bootflash memory map layout in Table 4-4 to 16KB.

• Added the following note to the description of the TMS signal in Table 2-2:

Note: Always tie the TMS pin to VDD through a 2.2K resistor.

• Added the following note to the description of the TRST signal in Table 2-2:

Note: For normal operation, connect TRST directly to VSS. If the design is to be used in a

debugging environment, TRST may be tied to VSS through a 1K resistor.

Please see http://www.freescale.com for the most current data sheet revision.

56F8355 Technical Data, Rev. 17

2

Freescale Semiconductor

Preliminary

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