NXP Semiconductors
74AHC244; 74AHCT244
Octal buffer/line driver; 3-state
VI 90 %
tW
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VM
tr
tf
VM
PULSE
VI
GENERATOR
VCC
VO
DUT
RT
VCC
RL S1
CL
open
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Test data is given in Table 9.
Definitions test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator
CL = Load capacitance including jig and probe capacitance
RL = Load resistor
S1 = Test selection switch
Fig 8. Load circuitry for switching times
Table 9. Test data
Type
Input
74AHC244
74AHCT244
VI
VCC
3.0 V
tr, tf
3.0 ns
3.0 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
RL
1 kΩ
1 kΩ
S1 position
tPHL, tPLH
open
open
tPZH, tPHZ
GND
GND
tPZL, tPLZ
VCC
VCC
74AHC_AHCT244_5
Product data sheet
Rev. 05 — 20 December 2007
© NXP B.V. 2007. All rights reserved.
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