74F181 データシートの表示（PDF） - Philips Electronics

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74F181

Arithmeticlogic unit

Philips Electronics 

Philips Semiconductors FAST Products

Arithmetic logic unit

Product specification

74F181

RECOMMENDED OPERATING CONDITIONS

SYMBOL

PARAMETER

LIMITS

MIN

NOM

MAX

VCC

VIH

VIL

IIK

VOH

IOH

IOL

Tamb

Supply voltage

High-level input voltage

Low-level input voltage

Input clamp current

High level output voltage

High-level output current

Low-level output current

Operating free-air temperature range

4.5

5.0

5.5

2.0

0.8

–18

A=B only

4.5

Any output except A=B

–1

20

0

+70

UNIT

V

V

V

mA

V

mA

mA

°C

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST CONDITIONS1

LIMITS

MIN TYP2 MAX

UNIT

IOH

High-level output

current

A=B only

VCC = MIN, VIL = MAX; VIH = MIN, VOH = MAX

250

µA

VOH

High-level output

voltage

Any output

except A=B

VCC = MIN,

VIL = MAX,

VIH = MIN

VOL

Low-level output voltage

VCC = MIN,

VIL = MAX,

VIH = MIN

±10%VCC 2.5

IOH = MAX

V

±5%VCC

2.7

3.4

IOL = MAX

±10%VCC

±5%VCC

0.30 0.50

V

0.30 0.50

VIK

Input clamp voltage

VCC = MIN, II = IIK

II

Input current at maximum input voltage VCC = MAX, VI = 7.0V

IIH

High-level input current

VCC = MAX, VI = 2.7V

M

–0.73 –1.2

V

100

µA

20

µA

–0.6 mA

A0–A3, B0–B3

IIL

Low-level input current

S0–S3

VCC = MAX, VI = 0.5V

–1.8 mA

–2.4 mA

Cn

–3.0 mA

IOS

Short-circuit output

current3

Any output

except A=B

VCC = MAX

–60

–150 mA

ICCH

ICC

Supply current (total)

ICCL

VCC = MAX

S0–S3=M=A0–A3=4.5V,

B0–B3=Cn=GND

S0–S3=M=4.5V,

B0–B3=Cn=A0–A3=GND

43

65

mA

43

65

mA

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

March 3, 1989

6

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