DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

5962F9863201VCC データシートの表示(PDF) - Intersil

部品番号
コンポーネント説明
メーカー
5962F9863201VCC Datasheet PDF : 2 Pages
1 2
Data Sheet
ACS109MS
July 1999
File Number 4760
Radiation Hardened Dual J-K Flip-Flop
with Set and Reset
The Radiation Hardened ACS109MS is a Dual J-K Flip-
Flop with Set and Reset. These Flip-Flops have
independent J, K, Set, Reset, and Clock inputs and Q and
Q outputs. The outputs change state on the positive-going
transition of the clock. Set and Reset are accomplished
asynchronously by Low-level inputs. All inputs are buffered
and the outputs are designed for balanced propagation
delay and transition times.
The ACS109MS is fabricated on a CMOS Silicon on
Sapphire (SOS) process, which provides an immunity to
Single Event Latch-up and the capability of highly reliable
performance in any radiation environment. These devices
offer significant power reduction and faster performance
when compared to ALSTTL types.
Specifications for Rad Hard QML devices are controlled
by the Defense Supply Center in Columbus (DSCC). The
SMD numbers listed below must be used when ordering.
Detailed Electrical Specifications for the ACS109MS are
contained in SMD 5962-98632. A “hot-link” is provided
on our homepage for downloading.
http://www.intersil.com/spacedefense/spaceselect.htm
Ordering Information
ORDERING NUMBER
5962F9863201VCC
ACS109D/SAMPLE-03
5962F9863201VXC
ACS109K/SAMPLE-03
5962F9863201V9A
INTERNAL MARKETING
NUMBER
ACS109DMSR-03
ACS109D/SAMPLE-03
ACS109KMSR-03
ACS109K/SAMPLE-03
ACS109HMSR-03
Pinouts
ACS109MS
(SBDIP)
TOP VIEW
1R 1
1J 2
1K 3
1CP 4
1S 5
1Q 6
1Q 7
GND 8
16 VCC
15 2R
14 2J
13 2K
12 2CP
11 2S
10 2Q
9 2Q
Features
• QML Qualified Per MIL-PRF-38535 Requirements
• 1.25 Micron Radiation Hardened SOS CMOS
• Radiation Environment
- Latch-Up Free Under Any Conditions
- Total Dose (Max.) . . . . . . . . . . . . . . . . . 3 x 105 RAD(Si)
- SEU Immunity . . . . . . . . . . . . . <1 x 10-10 Errors/Bit/Day
- SEU LET Threshold . . . . . . . . . . . . >100MeV/(mg/cm2)
• Input Logic Levels. . . . VIL = (0.3)(VCC), VIH = (0.7)(VCC)
• Output Current . . . . . . . . . . . . . . . . . . . . . . . . . . ±12mA (Min)
• Quiescent Supply Current . . . . . . . . . . . . . . . 10µA (Max)
• Propagation Delay . . . . . . . . . . . . . . . . . . . . . . 25ns (Max)
Applications
• High Speed Control Circuits
• Sensor Monitoring
• Low Power Designs
TEMP. RANGE (oC)
-55 to 125
25
-55 to 125
25
25
PACKAGE
16 Ld SBDIP
16 Ld SBDIP
16 Ld Flatpack
16 Ld Flatpack
Die
DESIGNATOR
CDIP2-T16
CDIP2-T16
CDFP4-F16
CDFP4-F16
NA
ACS109MS
(FLATPACK)
TOP VIEW
1R
1
16
VCC
1J
2
15
2R
1K
3
14
2J
1CP
4
13
2K
1S
5
12
2CP
1Q
6
11
2S
1Q
7
10
2Q
GND
8
9
2Q
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]