EVAL-AD5415EBZ データシートの表示（PDF） - Analog Devices

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EVAL-AD5415EBZ

Dual 12-Bit, High Bandwidth, Multiplying DAC with 4-Quadrant Resistors and Serial Interface

Analog Devices 

ABSOLUTE MAXIMUM RATINGS

Transient currents of up to 100 mA do not cause SCR latch-up.

TA = 25°C, unless otherwise noted.

Table 3.

Parameter

VDD to GND

VREF, RFB to GND

IOUT1, IOUT2 to GND

Input Current to Any Pin Except Supplies

Logic Inputs and Output1

Operating Temperature Range

Extended (Y Version)

Storage Temperature Range

Junction Temperature

24-Lead TSSOP, θJA Thermal Impedance

Lead Temperature, Soldering (10 sec)

IR Reflow, Peak Temperature (<20 sec)

Rating

−0.3 V to +7 V

−12 V to +12 V

−0.3 V to +7 V

±10 mA

−0.3 V to VDD + 0.3 V

−40°C to +125°C

−65°C to +150°C

150°C

128°C/W

300°C

235°C

1 Overvoltages at SCLK, SYNC, and SDIN are clamped by internal diodes.

AD5415

Stresses above those listed under Absolute Maximum Ratings

may cause permanent damage to the device. This is a stress

rating only; functional operation of the device at these or any

other conditions above those indicated in the operational

section of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect

device reliability.

ESD CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on

the human body and test equipment and can discharge without detection. Although this product features

proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy

electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance

degradation or loss of functionality.

Rev. B | Page 7 of 32

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