ADP3629 データシートの表示（PDF） - Analog Devices

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ADP3629

High Speed, Dual, 2 A MOSFET Driver

Analog Devices 

ADP3629/ADP3630/ADP3631

SPECIFICATIONS

VDD = 12 V, TJ = −40°C to +125°C, unless otherwise noted.1

Table 1.

Parameter

Symbol Test Conditions/Comments

Min

Typ

Max

Unit

SUPPLY

Supply Voltage Range

Supply Current

VDD

9.5

18

V

IDD

No switching, INA, INA, INB, and INB

1.2

3

mA

disabled

Standby Current

ISBY

SD = 5 V

1.2

3

mA

UVLO

Turn-On Threshold Voltage

Turn-Off Threshold Voltage

Hysteresis

VUVLO_ON VDD rising, TA = 25°C

VUVLO_OFF VDD falling, TA = 25°C

8.0

8.7

9.5

V

7.0

7.7

8.5

V

1.0

V

DIGITAL INPUTS (INA, INA, INB, INB, SD)

Input Voltage High

Input Voltage Low

Input Current

SD Threshold High

VIH

VIL

IIN

VSD_H

0 V < VIN < VDD

TA = 25°C

2.0

V

0.8

V

−20

+20

μA

1.19

1.28

1.38

V

1.21

1.28

1.35

V

SD Threshold Low

VSD_L

TA = 25°C

0.95

1.0

1.05

V

SD Hysteresis

Internal Pull-Up/Pull-Down Current

VSD_HYST TA = 25°C

240

280

320

mV

6

μA

OUTPUTS (OUTA, OUTB)

Output Resistance, Unbiased

VDD = PGND

80

kΩ

Peak Source Current

See Figure 20

2

A

Peak Sink Current

See Figure 20

−2

A

SWITCHING TIME

OUTA, OUTB Rise Time

tRISE

OUTA, OUTB Fall Time

tFALL

OUTA, OUTB Rising Propagation Delay tD1

OUTA, OUTB Falling Propagation Delay tD2

CLOAD = 2.2 nF, see Figure 3 and Figure 4

CLOAD = 2.2 nF, see Figure 3 and Figure 4

CLOAD = 2.2 nF, see Figure 3 and Figure 4

CLOAD = 2.2 nF, see Figure 3 and Figure 4

10

25

ns

10

25

ns

14

30

ns

22

35

ns

SD Propagation Delay Low

tdL_SD

See Figure 2

32

45

ns

SD Propagation Delay High

Delay Matching Between Channels

tdH_SD

See Figure 2

48

75

ns

2

ns

OVERTEMPERATURE PROTECTION

Overtemperature Warning Threshold

Overtemperature Shutdown Threshold

Temperature Hysteresis for Shutdown

Temperature Hysteresis for Warning

Overtemperature Warning Low

TW

TSD

THYS_SD

THYS_W

VOTW_OL

See Figure 6

See Figure 6

See Figure 6

See Figure 6

Open drain, −500 μA

120

135

150

°C

150

165

180

°C

30

°C

10

°C

0.4

V

1 All limits at temperature extremes guaranteed via correlation using standard statistical quality control (SQC) methods.

Rev. 0 | Page 3 of 16

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