EVAL-ADXL312Z データシートの表示（PDF） - Analog Devices

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EVAL-ADXL312Z

3-Axis, ±1.5 g/±3 g/±6 g/±12 g Digital Accelerometer

Analog Devices 

ADXL312

1 All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed.

2 Cross-axis sensitivity is defined as coupling between any two axes.

3 Bandwidth is half the output data rate.

4 Self-test change is defined as the output (g) when the SELF_TEST bit = 1 (in the DATA_FORMAT register) minus the output (g) when the SELF_TEST bit = 0 (in the

DATA_FORMAT register). Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self-test, where τ = 1/(data rate).

5 Turn-on and wake-up times are determined by the user-defined bandwidth. At a 100 Hz data rate, the turn-on and wake-up times are each approximately 11.1 ms. For

other data rates, the turn-on and wake-up times are each approximately τ + 1.1 in milliseconds, where τ = 1/(data rate).

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