DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

ADXL362 データシートの表示(PDF) - Analog Devices

部品番号
コンポーネント説明
メーカー
ADXL362 Datasheet PDF : 43 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Data Sheet
ADXL362
Parameter
Supply Current
Measurement Mode
Normal Operation
Low Noise Mode
Ultralow Noise Mode
Wake-Up Mode
Standby
Power Supply Rejection Ratio (PSRR)
Input Frequency 100 Hz to 1 kHz
Input Frequency 1 kHz to 250 kHz
Turn-On Time
Power-Up to Standby
Measurement Mode Instruction to
Valid Data
TEMPERATURE SENSOR
Bias Average
Standard Deviation
Sensitivity Average
Standard Deviation
Sensitivity Repeatability
Resolution
ENVIRONMENTAL
Operating Temperature Range
Test Conditions/Comments
Min
100 Hz ODR (50 Hz bandwidth)6
CS = 1.0 µF, RS = 100 Ω, CIO = 1.1 µF, input
is 100 mV sine wave on VS
100 Hz ODR (50 Hz bandwidth)
@ 25°C
−40
Typ
1.8
3.3
13
0.27
0.01
−13
−20
5
4/ODR
350
290
0.065
0.0025
±0.5
12
Max Unit
µA
µA
µA
µA
µA
dB
dB
ms
LSB
LSB
°C/LSB
°C/LSB
°C
Bits
+85 °C
1 All minimum and maximum specifications are guaranteed. Typical specifications may not be guaranteed.
2 Cross axis sensitivity is defined as coupling between any two axes.
3 −40°C to +25°C or +25°C to +85°C.
4 Different supplies and measurement range cause different offset.
5 Self test change is defined as the output change in g when self test is asserted. Different supplies cause different self test changes. These limits apply to the specific
test conditions stated in Table 1. For variations over the full Vs supply range, see Table 22.
6 Refer to Figure 30 for current consumption at other bandwidth settings.
Rev. E | Page 5 of 43

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]