AM29F200BB-75 データシートの表示（PDF） - Advanced Micro Devices

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コンポーネント説明

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AM29F200BB-75

2 Megabit (256 K x 8-Bit/128 K x 16-Bit) CMOS 5.0 Volt-only, Sectored Flash Memory—Die Revision 1

Advanced Micro Devices 

SUPPLEMENT

PRODUCT TEST FLOW

Figure 1 provides an overview of AMD’s Known Good

Die test flow. For more detailed information, refer to the

Am29F200B product qualification database supple-

ment for KGD. AMD implements quality assurance pro-

cedures throughout the product test flow. In addition,

an off-line quality monitoring program (QMP) further

guarantees AMD quality standards are met on Known

Good Die products. These QA procedures also allow

AMD to produce KGD products without requiring or

implementing burn-in.

Wafer Sort 1

Bake

24 hours at 250°C

DC Parameters

Functionality

Programmability

Erasability

Data Retention

Wafer Sort 2

DC Parameters

Functionality

Programmability

Erasability

Wafer Sort 3

Hot Temperature

DC Parameters

Functionality

Programmability

Erasability

Speed

Packaging for Shipment

Incoming Inspection

Wafer Saw

Die Separation

100% Visual Inspection

Die Pack

Shipment

Figure 1. AMD KGD Product Test Flow

Am29F200B Known Good Die

7

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