AT28C16 データシートの表示（PDF） - Atmel Corporation

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AT28C16

16K (2K x 8) Parallel EEPROMs

Atmel Corporation 

AC Read Characteristics

Symbol

tACC

tCE(1)

tOE(2)

tDF(3)(4)

tOH

Parameter

Address to Output Delay

CE to Output Delay

OE to Output Delay

CE or OE High to Output Float

Output Hold from OE, CE or Address, whichever occurred first

AC Read Waveforms(1)(2)(3)(4)

AT28C16

AT28C16-15

Min

Max

150

150

10

70

0

50

0

Units

ns

ns

ns

ns

ns

Notes:

1. CE may be delayed up to tACC - tCE after the address transition without impact on tACC.

2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE or by tACC - tOE after an address change

without impact on tACC.

3. tDF is specified from OE or CE whichever occurs first (CL = 5 pF).

4. This parameter is characterized and is not 100% tested.

Input Test Waveforms and

Measurement Level

Output Test Load

tR, tF < 20 ns

Pin Capacitance

f = 1 MHz, T = 25°C(1)

Symbol

Typ

Max

CIN

COUT

Note:

4

6

8

12

1. This parameter is characterized and is not 100% tested.

Units

pF

pF

Conditions

VIN = 0V

VOUT = 0V

5

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