ATF-55143 データシートの表示（PDF） - HP => Agilent Technologies
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ATF-55143
HP => Agilent Technologies
ATF-55143 Datasheet PDF : 22 Pages
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ATF-55143 Absolute Maximum Rating s[1]
Symbol
VDS
VGS
VGD
IDS
IGS
Pdiss
Pin max.
TCH
TSTG
θjc
Parameter
Drain-Source Voltage[2]
Gate-Source Voltage[2]
Gate Drain Voltage[2]
Drain Current[2]
Gate Current [5]
Total Power Dissipation[3]
RF Input Power[5]
Channel Temperature
Storage Temperature
Thermal Resistance [4]
ESD (Human Body Model)
ESD (Machine Model)
Units
V
V
V
mA
mA
mW
dBm
°C
°C
°C/W
V
V
Absolute
Maximum
5
-5 to 1
5
100
1
270
7
150
-65 to 150
235
200
25
Notes:
1. Operation of this device above any one of
these parameters may cause permanent
damage.
2. Assumes DC quiescent conditions.
3. Source lead temperature is 25°C. Derate
4.3 mW/ °C for TL > 87 °C.
4. Thermal resistance measured using
150°C Liquid Crystal Measurement method.
5. Device can safely handle +3 dBm RF Input
Power as long asIGS is limited to 1 mA. IGS at
P1dB drive level is bias circuit dependent. See
applications section for additional information.
70
60
50
40
30
20
10
0
0 12 3 45
VDS (V)
Figure 1. Typical I-V Curves.
(VGS = 0.1 V per step)
0.7 V
0.6 V
0.5 V
0.4 V
0.3V
67
Product Consistency Distribution Charts [6, 7]
300
250
200
-3 Std
150
100
Cpk = 2.02
Stdev = 0.36
200
Cpk = 1.023
Stdev = 0.28
160
120
-3 Std
80
50
40
240
200
160
+3 Std
120
80
40
Cpk = 3.64
Stdev = 0.031
+3 Std
0
22
23
24
25
26
OIP3 (dBm)
Figure 2. OIP3 @ 2.7 V, 10 mA.
LSL = 22.0, Nominal = 24.2
0
15
16
17
18
19
GAIN (dB)
Figure 3. Gain @ 2.7 V, 10 mA.
USL = 18.5, LSL = 15.5, Nominal = 17.7
0
0.43 0.53 0.63 0.73 0.83 0.93
NF (dB)
Figure 4. NF @ 2.7 V, 10 mA.
USL = 0.9, Nominal = 0.6
Notes:
6. Distribution data sample size is 500 samples taken from 6 different wafers. Future wafers allocated to this product may have nominal values anywhere
between the upper and lower limits.
7. Measurements made on production test board. This circuit represents a trade-off between an optimal noise match and a realizeable match based on
production test equipment. Circuit losses have been de-embedded from actual measurements.
2
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