KA337 データシートの表示（PDF） - Fairchild Semiconductor
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KA337 Datasheet PDF : 8 Pages
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Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be opera-
ble above the recommended operating conditions and stressing the parts to these levels is not recommended. In addi-
tion, extended exposure to stresses above the recommended operating conditions may affect device reliability. The
absolute maximum ratings are stress ratings only. Values are at TA = 25°C unless otherwise noted.
Symbol
Parameter
Value
Unit
IVI - VOI
PD
RθJC
TOPR
TSTG
Input-Output Voltage Differential
Power Dissipation
Thermal Resistance, Junction to Case
Operating Temperature Range
Storage Temperature Range
40
Internally Limited
4
0 to +125
-65 to +125
V
W
°C/W
°C
°C
Electrical Characteristics
VI - VO = 5 V, IO = 40 mA, 0°C ≤ TJ ≤ +125°C, PDMAX = 20 W; unless otherwise specified.
Symbol
Parameter
Conditions
Min. Typ. Max. Unit
Rline
Rload
IADJ
ΔIADJ
VREF
STT
IL(MIN)
eN
Line Regulation(1)
Load Regulation(1)
Adjustable Pin Current
Adjustable Pin Current Change
Reference Voltage
Temperature Stability
Minimum Load Current to Maintain
Regulation
RMS Noise, % of VOUT
TA = +25°C,
3 V ≤ I VI - VO I ≤ 40 V
3 V ≤ I VI - VO I ≤ 40 V
TA = +25°C,
10 mA ≤ IO ≤ 0.5 A
10 mA ≤ IO ≤ 1.5 A
TA = +25°C,
10 mA ≤ IO ≤ 1.5 A,
3 V ≤ I VI - VO I ≤ 40 V
TA =+25°C
3 V ≤ I VI - VO I ≤ 40 V,
10 mA ≤ IO ≤ 1.5 A
0°C ≤ TJ ≤ +125°C
3 V ≤ I VI - VO I ≤ 40 V
3 V ≤ I VI - VO I ≤ 10 V
TA =+25°C,
10 Hz ≤ f ≤ 10 kHz
0.01 0.04
%/ V
0.02 0.07
15
50
mV
15
150
50
100
μA
2
5
μA
-1.213 -1.250 -1.287
V
-1.200 -1.250 -1.300
0.6
%
2.5 10.0
mA
1.5
6.0
0.003
%
RR
Ripple Rejection Ratio
ST
Long-Term Stability
VO = -10 V, f = 120 Hz
CADJ = 10 μF(2)
TJ = 125°C, 1000 Hours
60
dB
66
77
0.3
1.0
%
Notes:
1. Load and line regulation are specified at constant junction temperature. Change in VO due to heating effects must be
taken into account separately. Pulse testing with low duty is used.
2. CADJ, when used, is connected between the adjustment pin and ground.
© 2011 Fairchild Semiconductor Corporation
KA337 / LM337 Rev. 1.1.1
2
www.fairchildsemi.com
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