BS616UV8011 データシートの表示（PDF） - Brilliance Semiconductor
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BS616UV8011 Datasheet PDF : 10 Pages
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BSI
BS616UV8011
DC ELECTRICAL CHARACTERISTICS ( TA = 0 to + 70oC )
PARAMETER
NAME
PARAMETER
TEST CONDITIONS
MIN. TYP.(1) MAX.
Guaranteed Input Low
VIL
Voltage(2)
Vcc=2V -0.5
--
0.6
Guaranteed Input High
VIH
Voltage(2)
Vcc=2V 1.4
--
Vcc+0.2
IIL
Input Leakage Current
Vcc = Max, VIN = 0V to Vcc
--
--
1
IOL
Output Leakage Current
Vcc = Max, CE1 = VIH, or CE2 = ViL, or
OE = VIH, VI/O = 0V to Vcc
--
--
1
VOL
Output Low Voltage
Vcc = Max, IOL = 1mA
Vcc=2V
--
--
0.4
VOH
Output High Voltage
Vcc = Min, IOH= - 0.5mA
Vcc=2V 1.6
--
--
ICC
Operating Power Supply
Current
Vcc=max, CE1=VIL and CE2= Vcc=2V
VIH, IDQ = 0mA, F = Fmax(3)
--
--
20
ICCSB
Standby Current -TTL
Vcc= max, CE1 =VIH or CE2 = Vcc=2V
VIL ,IDQ = 0mA
--
--
0.6
Vcc= max,CE1Њ Vcc-0.2V, or
ICCSB1
Standby Current -CMOS CE2 Љ 0.2V, VINЊ Vcc - 0.2V Vcc=2V
--
0.6
15
or VIN Љ 0.2V
1. Typical characteristics are at TA = 25oC.
2. These are absolute values with respect to device ground and all overshoots due to system or tester notice are included.
3. Fmax = 1/tRC .
DATA RETENTION CHARACTERISTICS ( TA = 0 to + 70oC )
UNITS
V
V
uA
uA
V
V
mA
mA
uA
SYMBOL
PARAMETER
TEST CONDITIONS
MIN. TYP. (1) MAX.
UNITS
VDR
Vcc for Data Retention
CE1 Њ Vcc - 0.2V or CE2Љ0.2V
VIN Њ Vcc - 0.2V or VIN Љ 0.2V
1.5
--
--
V
ICCDR
Data Retention Current
CE1 Њ Vcc - 0.2V or CE2Љ0.2V
VIN Њ Vcc - 0.2V or VIN Љ 0.2V
--
0.4
10
uA
tCDR
Chip Deselect to Data
Retention Time
See Retention Waveform
tR
Operation Recovery Time
0
--
--
ns
TRC (2)
--
--
ns
1. Vcc = 1.5V, TA = + 25OC
2. tRC = Read Cycle Time
LOW VCC DATA RETENTION WAVEFORM (1) ( CE1 Controlled )
Vcc
CE1
Vcc
t CDR
VIH
Data Retention Mode
VDR ≥ 1.5V
CE1≥ Vcc - 0.2V
LOW VCC DATA RETENTION WAVEFORM (2) ( CE2 Controlled )
Vcc
tR
VIH
Vcc
CE2
Vcc
t CDR
VIL
Data Retention Mode
VDR Њ 1.5V
CE2 Љ 0.2V
Vcc
tR
VIL
R0201-BS616UV8011
3
Revision 2.2
April 2001
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