CAT28C17AJA-20T データシートの表示（PDF） - ON Semiconductor
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CAT28C17AJA-20T Datasheet PDF : 12 Pages
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CAT28C17A
Table 4. RELIABILITY CHARACTERISTICS (Note 4)
Symbol
Parameter
Test Method
Min
Max
NEND
Endurance
MIL−STD−883, Test Method 1033
10,000
TDR
Data Retention
MIL−STD−883, Test Method 1008
10
VZAP
ESD Susceptibility
MIL−STD−883, Test Method 3015
2,000
ILTH (Note 5)
Latch−Up
JEDEC Standard 17
100
4. This parameter is tested initially and after a design or process change that affects the parameter.
5. Latch−up protection is provided for stresses up to 100 mA on address and data pins from −1 V to VCC + 1 V.
Units
Cycles/Byte
Years
V
mA
Table 5. D.C. OPERATING CHARACTERISTICS (VCC = 5 V ±10%, unless otherwise specified.)
Limits
Symbol
Parameter
Test Conditions
Min
Typ
Max
ICC
VCC Current (Operating, TTL)
CE = OE = VIL,
35
f = 1/tRC min, All I/O’s Open
ICCC (Note 6)
VCC Current (Operating, CMOS) CE = OE = VILC,
25
f = 1/tRC min, All I/O’s Open
ISB
VCC Current (Standby, TTL)
CE = VIH, All I/O’s Open
1
ISBC (Note 7)
VCC Current (Standby, CMOS)
CE = VIHC, All I/O’s Open
100
ILI
Input Leakage Current
VIN = GND to VCC
−10
10
ILO
Output Leakage Current
VOUT = GND to VCC,
−10
10
CE = VIH
VIH (Note 7)
High Level Input Voltage
VIL (Note 6)
Low Level Input Voltage
VOH
High Level Output Voltage
VOL
Low Level Output Voltage
VWI
Write Inhibit Voltage
6. VILC = −0.3 V to +0.3 V
7. VIHC = VCC −0.3 V to VCC + 0.3 V
IOH = −400 mA
IOL = 2.1 mA
2
−0.3
2.4
3.0
VCC + 0.3
0.8
0.4
Units
mA
mA
mA
mA
mA
mA
V
V
V
V
V
Table 6. A.C. CHARACTERISTICS, READ CYCLE (VCC = 5 V ±10%, unless otherwise specified.)
28C17A−20
Symbol
Parameter
Min
Max
tRC
Read Cycle Time
200
tCE
CE Access Time
200
tAA
Address Access Time
200
tOE
OE Access Time
80
tLZ (Note 8)
CE Low to Active Output
0
tOLZ (Note 8)
OE Low to Active Output
0
tHZ (Notes 8, 9) CE High to High−Z Output
55
tOHZ (Notes 8, 9) OE High to High−Z Output
55
tOH (Note 8)
Output Hold from Address Change
0
8. This parameter is tested initially and after a design or process change that affects the parameter.
9. Output floating (High−Z) is defined as the state when the external data line is no longer driven by the output buffer.
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
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