CY7C198 データシートの表示（PDF） - Cypress Semiconductor

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CY7C198

32K x 8 Static RAM

Cypress Semiconductor 

7c198: 10/25/89

Revision: February 29, 1996

CY7C198

Electrical Characteristics Over the Operating Range[17]

7C198-15

7C198-20

7C198-25

7C198-35, 45

Parameter

Description

Test Conditions

Min.

Max.

Min.

Max.

Min. Max. Min.

Max. Unit

VOH

VOL

VIH

Output HIGH

Voltage

Output LOW

Voltage

Input HIGH

Voltage

VCC = Min.,

IOH = -4.0 mA

VCC = Min.,

IOL = 8.0 mA

2.4

2.4

2.4

2.4

V

0.4

0.4

0.4

0.4

V

2.2

VCC

2.2

VCC

2.2

VCC

2.2

VCC

V

+0.3V

+0.3V

VIL

IIX

IOZ

IOS

ICC

ISB1

Input LOW

Voltage[15]

Input Load Current GND < VI < VCC

Output Leakage

Current

GND < VO < VCC,

Output Disabled

-0.5

0.8

-0.5

0.8

-0.5

0.8

-0.5

0.8

V

-5

-5

+5

+5

-5

-5

+5

+5

-5

-5

+5

+5

-5

-5

+5

+5

mA

mA

Output Short

Circuit Current[18]

VCC Operating

Supply Current

VCC = Max.,

VOUT = GND

VCC = Max.,

IOUT = 0 mA,

f = fMAX = 1/tRC

Com'l

Mil

-300

180

-300

150

170

-300

150

-300 mA

mA

150

Automatic CE

PowerĆDown

CurrentĊ TTL

Inputs

Max. VCC, CE > VIH,

VIN > VIH

or VIN < VIL, f = fMAX

30

30

30

25

mA

ISB2

Automatic CE

PowerĆDown

CurrentĊ CMOS

Inputs

Max. VCC,

CE > VCC - 0.3V

VIN > VCC - 0.3V or

VIN < 0.3V, f = 0

Shaded area contains preliminary information

Capacitance[19]

15

15

Parameter

CIN

COUT

Description

Input Capacitance

Output Capacitance

Test Conditions

_ TA = 25 C, f = 1 MHz,

VCC = 5.0V

15

Max.

10

10

15

mA

Unit

pF

pF

Notes:

17. See the last page of this specification for Group A subgroup testing inĆ

formation.

18. Not more than one output should be shorted at one time. Duration of

the short circuit should not exceed 30 seconds.

19. Tested initially and after any design or process changes that may affect

these parameters.

3

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