EL3010(2011) データシートの表示（PDF） - EVERLIGHT

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EL3010
(Rev.:2011)

5 PIN DIP RANDOM-PHASE TRIAC DRIVER PHOTOCOUPLER

EVERLIGHT 

EL301X(P5) Series

5 PIN DIP RANDOM-PHASE TRIAC DRIVER EL302X(P5) Series

PHOTOCOUPLER

EL305X(P5) Series

Figure 8. Static dv/dt Test Circuit & Waveform

D.U.T.

T1

10 kΩ

A

K

VT

CTEST

RTEST

50 Ω

T2

High Voltage

Pulse Source

0.632 x VPEAK

Measurement Method

Applied VT

Waveform

τRC

VPEAK

0

The high voltage pulse is set to the required VPEAK value and applied to the D.U.T. output side through the RC

circuit above. LED current is not applied. The waveform VT is monitored using a x100 scope probe. By

varying RTEST, the dv/dt (slope) is increased, until the D.U.T. is observed to trigger (waveform collapses). The

dv/dt is then decreased until the D.U.T. stops triggering. At this point, τRC is recorded and the dv/dt calculated.

dv/dt = 0.632 x VPEAK

τRC

： Everlight Electronics Co., Ltd.

Document No DPC-0000075 Rev. 1

5

http://www.everlight.com

October 1,2011

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