FAH4820 データシートの表示（PDF） - Fairchild Semiconductor
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FAH4820 Datasheet PDF : 14 Pages
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Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
Parameter
VDD DC Supply Voltage
VIO Analog and Digital I/O (All Input and Output Pins)
Min.
-0.3
-0.3
Max.
6.0
VCC+0.3
Unit
V
V
Reliability Information
Symbol
Parameter
TJ
TSTG
JA
Junction Temperature
Storage Temperature Range
Thermal Resistance, JEDEC Standard, Multi-Layer Test Boards, Still Air
Min.
-65
Typ.
200
Max.
+150
+150
Unit
°C
°C
°C/W
Electrostatic Discharge Information
Symbol
Parameter
Human Body Model, JESD22-A114
ESD
Charged Device Model, JESD22-C101
Max.
±4
±1
Unit
kV
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to Absolute Maximum Ratings.
Symbol
Parameter
TA Operating Temperature Range
VDD Supply Voltage Range
Min.
-40
2.7
Typ.
3.3
Max.
+85
5.5
Unit
°C
V
© 2013 Fairchild Semiconductor Corporation
FAH4820 • 1.0.0
3
www.fairchildsemi.com
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