FMBT3906(2011) データシートの表示（PDF） - Formosa Technology

部品番号

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FMBT3906
(Rev.:2011)

PNP Epitaxial Planar Transistor

Formosa Technology 

PNP Epitaxial Planar Transistor

FMBT3906

High reliability test capabilities

Item Test

Conditions

1. Steady State Operating Life

PD=225mW Test Duration:1000hrs

Formosa MS

2. High Temperature Reverse Bias

3. Temperature Cycle

4. Autoclave

Tj= 150℃, V = CE 80% related volage, 1000hrs

-55℃( 15min) to 150℃( 15min)Air to Air Transition Time< 20sec Test Cycles:1000cycle

P=2atm Ta=121℃ RH=100% Test Duration:96hrs

5. High Temperature Storage Life

Ta=150℃ Test Duration:1000hrs

6. Solderability

245℃,5sec

7. High Temperature High Humidity Reverse

Bias

Ta= 85℃, 85% RH, V = CE 80% related volage, 1000hrs

8. Resistance to Soldering Heat

260℃,10sec

http://www.formosams.com/

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FAX:886-2-22696141

Page 10

Document ID Issued Date

DS-231113

2008/02/10

Revised Date Revision

2011/07/21

E

Page.

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