HCPL-0708 データシートの表示（PDF） - Avago Technologies

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HCPL-0708

High Speed CMOS Optocoupler

Avago Technologies 

Package Characteristics

All Typicals at TA = 25°C.

Parameter

Symbol

Min. Typ. Max. Units

Test Conditions

Input-Output Insulation

II-O

1

µA

45% RH, t = 5 s

VI-O = 3 kV dc,

TA = 25°C

Input-Output Momentary

VISO

3750

Vrms

Withstand Voltage

RH ≤ 50%, t = 1 min.,

TA = 25°C

Input-Output Resistance

RI-O

1012

Ω

VI-O = 500 V dc

Input-Output Capacitance

CI-O

0.6

pF

f = 1 MHz, TA = 25°C

Notes:

  1. tPHL propagation delay is measured from the 50% level on the risiing edge of the input pulse to the 2.5 V level of the falling edge of the VO

signal. tPLH propagation delay is measured from the 50% level on the falling edge of the input pulse to the 2.5 V level of the rising edge of the

VO signal.

  2. PWD is defined as |tPHL - tPLH|.

  3. tPSK is equal to the magnitude of the worst case difference in tPHL and/or tPLH that will be seen between units at any given temperature within

the recommended operating conditions.

  4. CMH is the maximum tolerable rate of rise of the common mode voltage to assure that the output will remain in a high logic state.

  5. CML is the maximum tolerable rate of fall of the common mode voltage to assure that the output will remain in a low logic state.



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