ICP-S データシートの表示（PDF） - ROHM Semiconductor

部品番号

コンポーネント説明

メーカー

ICP-S

Overcurrent Protection Elements

ROHM Semiconductor 

Overcurrent Protection Elements

7. ICP-S Test Example

7-1 Example 1

Current mode: DC

Model: ICP-S1.0

Wave form:

DC 1A

2A

5A

ICP-S Technical Manual

Test:

The current values of all segmented periods are plotted respectively as shown in attached graph 1.

1 A: The steady-state current is in the safety area where the ICP-S will not deteriorate or break the current.

2 A: The ICP-S will break the steady-state current in the breaking current area in approximately 100 ms.

5 A: The ICP-S will break the steady-state current in the breaking current area in approximately 0.7 ms.

7-2 Example 2

Current mode: A single pulse

Model: ICP-S1.0

Wave form: A current of 1.75 A flows for a period of 20 ms.

1.75A

20ms

Results: The steady-state current is in the critical area. If the single pulse is repeated intermittently,

the ICP-S will deteriorate or break the current in the end.

Test:

With pulse current: I2t = 1.752×20

= 61 (A2 • ms) at 20ms (See graph 2)

Rev.A

7/13

Share Link: