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IDT49FCT806/A データシートの表示(PDF) - Integrated Device Technology

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IDT49FCT806/A
IDT
Integrated Device Technology IDT
IDT49FCT806/A Datasheet PDF : 7 Pages
1 2 3 4 5 6 7
IDT49FCT806/A
FAST CMOS BUFFER/CLOCK DRIVER
COMMERCIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC - 0.2V
Commercial: TA = 0°C to +70°C, VCC = 5V ± 5%
Symbol
Parameter
Test Conditions(1)
Min.
Typ.(2) Max.
Unit
VIH
Input HIGH Level
VIL
Input LOW Level
IIH
Input HIGH Current
IIL
Input LOW Current
IOZH
Off State (Hi-Z) Output Current
IOZL
VIK
Clamp Diode Voltage
IOS
Short Circuit Current
VOH
Output HIGH Voltage
VOL
Output LOW Voltage
VH
Input Hysteresis for all inputs
ICC
Quiescent Power Supply Current
Guaranteed Logic HIGH Level
Guaranteed Logic LOW Level
VCC = Max.
VI = VCC
VCC = Max.
VI = GND
VCC = Max.
VO = VCC
VO = GND
VCC = Min., IIN = –18mA
VCC = Max., VO = GND(3)
VCC = 3V, VIN = VLC or VHC IOH = –32µA
VCC = Min.
IOH = –300µA
VIN = VIH or VIL
IOH = –15mA
IOH = –24mA
VCC = 3V, VIN = VLC or VHC IOL = 300µA
VCC = Min.
IOL = 300mA
VIN = VIH or VIL
IOL = 64mA
VCC = Max., VIN = GND or VCC
2
V
0.8
V
±1
µA
±1
µA
±1
µA
±1
–0.7
–1.2
V
–60
–120
mA
VHC
VCC
VHC
VCC
V
3.6
4.3
2.4
3.8
GND
VLC
GND
VLC
V
0.3
0.55
200
mV
5
500
µA
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
3

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