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IDT54FCT139TE データシートの表示(PDF) - Integrated Device Technology

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IDT54FCT139TE
IDT
Integrated Device Technology IDT
IDT54FCT139TE Datasheet PDF : 5 Pages
1 2 3 4 5
IDT54/74FCT139T/AT/CT
FAST CMOS DUAL 1-OF-4 DECODER WITH ENABLE
MILITARY AND COMMERCIAL TEMPERATURE RANGES
ABSOLUTE MAXIMUM RATINGS(1)
Symbol
Rating
VTERM(2) Terminal Voltage
with Respect to
GND
VTERM(3) Terminal Voltage
with Respect to
GND
TA
Operating
Temperature
TBIAS Temperature
Under Bias
TSTG Storage
Temperature
PT
Power Dissipation
Commercial
–0.5 to +7.0
–0.5 to
VCC +0.5
0 to +70
–55 to +125
–55 to +125
0.5
Military
–0.5 to +7.0
–0.5 to
VCC +0.5
–55 to +125
–65 to +135
–65 to +150
0.5
Unit
V
V
°C
°C
°C
W
IOUT
DC Output
–60 to +120 –60 to +120 mA
Current
NOTES:
2566 lnk 03
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT-
INGS may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability. No terminal voltage may exceed
VCC by +0.5V unless otherwise noted.
2. Input and VCC terminals only.
3. Outputs and I/O terminals only.
PIN DESCRIPTION
Pin Names
A0, A1
E
O0 - O3
Description
Address Inputs
Enable Input (Active LOW)
Outputs (Active LOW)
2566 tbl 01
FUNCTION TABLE(1)
Inputs
Outputs
E
A0
A1
O0
O1
O2
O3
H
X
X
H
H
H
H
L
L
L
L
H
H
H
L
H
L
H
L
H
H
L
L
H
H
H
L
H
L
H
H
H
H
H
L
NOTE:
2566 tbl 02
1. H = HIGH Voltage Level; L = LOW Voltage Level; X = Don’t Care
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol Parameter(1) Conditions Typ. Max. Unit
CIN
Input
VIN = 0V
6
10 pF
Capacitance
COUT Output
VOUT = 0V 8
12 pF
Capacitance
NOTE:
2566 lnk 04
1. This parameter is measured at characterization but not tested.
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol
VIH
Parameter
Input HIGH Level
Test Conditions(1)
Guaranteed Logic HIGH Level
Min. Typ.(2) Max. Unit
2.0 —
V
VIL
Input LOW Level
II H
Input HIGH Current(4)
II L
Input LOW Current(4)
II
Input HIGH Current(4)
Guaranteed Logic LOW Level
VCC = Max.
VI = 2.7V
VCC = Max.
VI = 0.5V
VCC = Max., VI = VCC (Max.)
— 0.8
V
±1 µA
±1 µA
±1 µA
VIK
Clamp Diode Voltage
IOS
Short Circuit Current
VCC = Min., IN = –18mA
VCC = Max.(3), VO = GND
— –0.7 –1.2 V
–60 –120 –225 mA
VOH
Output HIGH Voltage
VOL
Output LOW Voltage
VH
Input Hysteresis
VCC = Min.
VIN = VIH or VIL
VCC = Min.
VIN = VIH or VIL
IOH = –6mA MIL.
2.4 3.3 —
V
IOH = –8mA COM'L.
IOH = –12mA MIL.
2.0 3.0 —
V
IOH = –15mA COM'L.
IOL = 32mA MIL.
— 0.3 0.5
V
IOL = 48mA COM'L.
— 200 — mV
ICC
Quiescent Power Supply Current VCC = Max.
— 0.01 1
VIN = GND or VCC
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient and maximum loading.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. The test limit for this parameter is ±5µA at TA = –55°C.
mA
2566 tbl 05
6.4
2

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