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IDT54FCT163652AEB データシートの表示(PDF) - Integrated Device Technology

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IDT54FCT163652AEB
IDT
Integrated Device Technology IDT
IDT54FCT163652AEB Datasheet PDF : 9 Pages
1 2 3 4 5 6 7 8 9
IDT54/74FCT163652/A/C
3.3V CMOS 16-BIT BUS TRANSCEIVER/REGISTER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
FUNCTION TABLE(2)
Inputs
xOEAB xOEBA xCLKAB xCLKBA
xSAB
xSBA
Data I/O(1)
xAx
xBx
Operation or Function
L
H
H or L H or L
X
X
Input
Input
Isolation
L
H
X
X
Store A and B Data
X
H
H or L
X
X
H
H
X(2)
X
Input
Input
Unspecified(1) Store A, Hold B
Output Store A in Both Registers
L
X
H or L
X
X
Unspecified(1)
Input
Hold A, Store B
L
L
X
X(2)
Output
Input
Store B in both Registers
L
L
X
X
X
L
Output
Input
L
L
X
H or L
X
H
H
H
X
X
L
X
Input
Output
H
H
H or L
X
H
X
H
L
H or L H or L
H
H
Output
Output
NOTES:
1. The data output functions may be enabled or disabled by various signals at the xOEAB or xOEBA inputs.
Data input functions are always enabled, i.e. data at the bus pins will be stored on every LOW-to-HIGH
transition on the clock inputs.
2. Select control = L: clocks can occur simultaneously.
Select control = H: clocks must be staggered to load both registers.
3. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don't Care
= LOW-to-HIGH Transition
Real Time B Data to A Bus
Stored B Data to A Bus
Real Time A Data to B Bus
Stored A Data to B Bus
Stored A Data to B Bus and
Stored B Data to A Bus
3084 tbl 03
CAPACITANCE (TA = +25°C, f = 1.0MHz)
ABSOLUTE MAXIMUM RATINGS(1)
Symbol Parameter(1) Conditions Typ. Max. Unit
CIN
Input
VIN = 0V
3.5 6.0 pF
Capacitance
CI/O
I/O
VOUT = 0V 3.5 8.0 pF
Capacitance
NOTE:
3084 lnk 02
1. This parameter is measured at characterization but not tested.
Symbol
VTERM(2)
VTERM(3)
VTERM(4)
TSTG
Description
Terminal Voltage with
Respect to GND
Terminal Voltage with
Respect to GND
Terminal Voltage with
Respect to GND
Storage Temperature
Max.
Unit
–0.5 to +4.6 V
–0.5 to +7.0 V
–0.5 to
V
VCC + 0.5
–65 to +150 °C
IOUT
DC Output Current
–60 to +60 mA
NOTES:
3084 lnk 04
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT-
INGS may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions for extended
periods may affect reliability.
2. Vcc terminals.
3. Input terminals.
4. Output and I/O terminals.
8.7
3

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