IDT7130SA100JI データシートの表示（PDF） - Integrated Device Technology

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IDT7130SA100JI

HIGH SPEED 1K X 8 DUAL-PORT STATIC SRAM

Integrated Device Technology 

IDT7130SA/LA and IDT7140SA/LA

High-Speed 1K x 8 Dual-Port Static SRAM

AC Test Conditions

Input Pulse Levels

GND to 3.0V

Input Rise/Fall Times

5ns

Input Timing Reference Levels

1.5V

Output Reference Levels

1.5V

Output Load

Figures 1,2 and 3

2689 tbl 08

Military, Industrial and Commercial Temperature Ranges

DATAOUT

775Ω

5V

1250Ω

30pF*

DATAOUT

775Ω

*100pF for 55 and 100ns versions

5V

1250Ω

5pF*

Figure 1. Output Test Load

5V

Figure 2. Output Test Load

(for tHZ, tLZ, tWZ, and tOW)

* including scope and jig

BUSY or INT

270Ω

30pF*

*100pF for 55 and 100ns versions

Figure 3. BUSY and INT

AC Output Test Load

2689 drw 07

7

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