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IDT71V424L データシートの表示(PDF) - Integrated Device Technology

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IDT71V424L
IDT
Integrated Device Technology IDT
IDT71V424L Datasheet PDF : 9 Pages
1 2 3 4 5 6 7 8 9
IDT71V424S, IDT71V424L, 3.3V CMOS Static RAM
4 Meg (512K x 8-bit)
Commercial and Industrial Temperature Ranges
Timing Waveform of Write Cycle No. 1 (WE Controlled Timing)(1, 2, 4)
ADDRESS
tWC
tAW
CS
WE
DATAOUT
DATAIN
tAS
(3)
tWHZ (5)
tWR
tWP (2)
HIGH IMPEDANCE
tDW
tOW (5)
tDH
DATAIN VALID
tCHZ (5)
(3)
3622 drw 08
Timing Waveform of Write Cycle No. 2 (CS Controlled Timing)(1, 4)
ADDRESS
CS
tWC
tAW
tAS
WE
DATAIN
tCW
tWR
tDW
tDH
DATAIN VALID
3622 drw 09
NOTES:
1. A write occurs during the overlap of a LOW CS and a LOW WE.
2. OE is continuously HIGH. During a WE controlled write cycle with OE LOW, tWP must be greater than or equal to tWHZ + tDW to allow the I/O drivers to turn off and
data to be placed on the bus for the required tDW. If OE is HIGH during a WE controlled write cycle, this requirement does not apply and the minimum write pulse
is the specified tWP.
3. During this period, I/O pins are in the output state, and input signals must not be applied.
4. If the CS LOW transition occurs simultaneously with or after the WE LOW transition, the outputs remain in a high impedance state. CS must be active during the tCW
write period.
5. Transition is measured ±200mV from steady state.
6.472

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