IDT74FCT827CEB データシートの表示（PDF） - Integrated Device Technology

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IDT74FCT827CEB

FAST CMOS 10-BIT BUFFERS

Integrated Device Technology 

IDT54/74FCT827A/B/C

HIGH-PERFORMANCE CMOS BUFFERS

MILITARY AND COMMERCIAL TEMPERATURE RANGES

DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE

Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC – 0.2V

Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%

Symbol

VIH

Parameter

Input HIGH Level

Test Conditions(1)

Guaranteed Logic HIGH Level

Min. Typ.(2) Max. Unit

2.0

—

—

V

VIL

Input LOW Level

Guaranteed Logic LOW Level

—

— 0.8

V

II H

Input HIGH Current

II L

Input LOW Current

VCC = Max.

VI = VCC

VI = 2.7V

VI = 0.5V

—

—

5

µA

—

—

5(4)

—

— –5(4)

VI = GND

—

—

–5

IOZH

Off State (High Impedance)

Output Current

IOZL

VCC = Max.

VO = VCC

VO = 2.7V

VO = 0.5V

—

—

10

µA

—

— 10(4)

—

— –10(4)

VO = GND

—

— –10

VIK

Clamp Diode Voltage

IOS

Short Circuit Current

VCC = Min., IN = –18mA

VCC = Max.(3), VO = GND

— –0.7 –1.2 V

–75 –120 — mA

VOH

Output HIGH Voltage

VCC = 3V, VIN = VLC or VHC, IOH = –32µA

VCC = Min.

IOH = –300µA

VHC VCC

—

V

VHC VCC

—

VIN = VIH or VIL

IOH = –15mA MIL.

2.4 4.3 —

IOH = –24mA COM'L. 2.4 4.3

—

VOL

Output LOW Voltage

VCC = 3V, VIN = VLC or VHC, IOL = 300µA

VCC = Min.

IOL = 300µA

— GND VLC

V

— GND VLC(4)

VIN = VIH or VIL

IOL = 32mA MIL.

— 0.3 0.5

IOL = 48mA COM'L.

— 0.3 0.5

NOTES:

1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.

2. Typical values are at VCC = 5.0V, +25°C ambient and maximum loading.

3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.

4. This parameter is guaranteed but not tested.

2609 tbl 06

7.20

3

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