12029IVZ データシートの表示（PDF） - Intersil
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12029IVZ Datasheet PDF : 29 Pages
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ISL12029, ISL12029A
Serial Interface (I2C) Specifications - DC/AC Characteristics (Continued)
SYMBOL
PARAMETER
CONDITIONS
MIN
MAX
(Note 16) TYP (Note 16) UNITS NOTES
tHIGH Clock HIGH Time
Measured at the 70% of VDD
600
ns
crossing.
tSU:STA START Condition Setup Time
SCL rising edge to SDA falling
600
edge. Both crossing 70% of VDD.
tHD:STA START Condition Hold Time
From SDA falling edge crossing
600
30% of VDD to SCL falling edge
crossing 70% of VDD.
tSU:DAT Input Data Setup Time
From SDA exiting the 30% to
100
70% of VDD window, to SCL rising
edge crossing 30% of VDD
tHD:DAT Input Data Hold Time
From SCL falling edge crossing
0
70% of VDD to SDA entering the
30% to 70% of VDD window.
tSU:STO STOP Condition Setup Time
From SCL rising edge crossing
600
70% of VDD, to SDA rising edge
crossing 30% of VDD.
tHD:STO STOP Condition Hold Time for
From SDA rising edge to SCL
600
Read, or Volatile Only Write
falling edge. Both crossing 70%
of VDD.
tDH
Output Data Hold Time
From SCL falling edge crossing
0
30% of VDD, until SDA enters the
30% to 70% of VDD window.
Cpin SDA, and SCL Pin Capacitance
ns
ns
ns
ns
ns
ns
ns
10
pF
tWC Non-Volatile Write Cycle Time
tR
SDA and SCL Rise Time
From 30% to 70% of VDD
12
20
20 +
250
0.1 x Cb
ms
14
ns
15
tF
SDA and SCL Fall Time
From 70% to 30% of VDD
20 +
0.1 x Cb
250
ns
15
Cb
Capacitive Loading of SDA or SCL Total on-chip and off-chip
10
400
pF
15
Rpu SDA and SCL Bus Pull-up Resistor Maximum is determined by tR and
1
Off-chip
tF.
For Cb = 400pF, max is about
2kΩ~2.5kΩ.
For Cb = 40pF, max is about
15kΩ~20kΩ
kΩ
15
NOTES:
7. IRQ/FOUT Inactive (no frequency output and no alarms).
8. VIL = VDD x 0.1, VIH = VDD x 0.9, fSCL = 400kHz.
9. VRESET = 2.63V (VDD must be greater than VRESET), VBAT = 0V.
10. Bit BSW = 0 (Standard Mode), ATR = 00h, VBAT ≥ 1.8V.
11. Specified at +25°C.
12. In order to ensure proper timekeeping, the VDD SR- specification must be followed.
13. Parameter is not 100% tested.
14. tWC is the minimum cycle time to be allowed for any non-volatile Write by the user, it is the time from valid STOP condition at the end of Write
sequence of a serial interface Write operation, to the end of the self-timed internal non-volatile write cycle.
15. These are I2C specific parameters and are not directly tested, however they are used during device testing to validate device specification.
16. Compliance to datasheet limits is assured by one or more methods: production test, characterization and/or design.
6
FN6206.10
December 16, 2010
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