Specifications ispLSI 2064V
Switching Test Conditions
Input Pulse Levels
GND to 3.0V
Figure 2. Test Load
Input Rise and Fall Time
10% to 90%
≤ 1.5 ns
+ 3.3V
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
3-state levels are measured 0.5V from
steady-state active level.
1.5V
1.5V
See Figure 2
Table 2-0003/2064V
Output Load Conditions (see Figure 2)
TEST CONDITION
A
R1
R2
CL
316Ω 348Ω 35pF
S Device
N Output
R1
Test
Point
R2
CL*
DESIG *CL includes Test Fixture and Probe Capacitance.
0213A/2064V
Active High
B
Active Low
W Active High to Z
E C
at VOH -0.5V
Active Low to Z
N at VOL+0.5V
∞
316Ω
∞
348Ω
348Ω
348Ω
35pF
35pF
5pF
316Ω
348Ω 5pF
Table 2-0004/2064V
OR DC Electrical Characteristics
F Over Recommended Operating Conditions
SYMBOL
PARAMETER
CONDITION
MIN. TYP.3 MAX. UNITS
E VOL
Output Low Voltage
IOL= 8 mA
–
–
0.4
V
V VOH
64 IIL
0 IIH
I 2 IIL-isp
S IIL-PU
L IOS1
Output High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
ispEN Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
IOH = -4 mA
0V ≤ VIN ≤ VIL (Max.)
(VCC – 0.2)V ≤ VIN ≤ VCC
VCC ≤ VIN ≤ 5.25V
0V ≤ VIN ≤ VIL
0V ≤ VIN ≤ VIL
VCC= 3.3V, VOUT= 0.5V
2.4
–
–
V
–
–
-10 µA
–
–
10
µA
–
–
50 mA
–
– -150 µA
–
– -150 µA
–
– -100 mA
p ICC2, 4 Operating Power Supply Current
VIL= 0.0V, VIH = 3.0V
fCLOCK = 1 MHz
–
82
–
mA
is 1. One output at a time for a maximum duration of one second. VOUT = 0.5V was selected to avoid test
problems by tester ground degradation. Characterized but not 100% tested.
Table 2-0007/2064V
E 2. Measured using four 16-bit counters.
3. Typical values are at VCC= 3.3V and TA= 25°C.
S 4. Maximum ICC varies widely with specific device configuration and operating frequency. Refer to the Power Consumption
Usection of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to
estimate maximum ICC .
4