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ISPLSI2064V-80LJ44 データシートの表示(PDF) - Lattice Semiconductor

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ISPLSI2064V-80LJ44
Lattice
Lattice Semiconductor Lattice
ISPLSI2064V-80LJ44 Datasheet PDF : 14 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Specifications ispLSI 2064V
Switching Test Conditions
Input Pulse Levels
GND to 3.0V
Figure 2. Test Load
Input Rise and Fall Time
10% to 90%
1.5 ns
+ 3.3V
Input Timing Reference Levels
Output Timing Reference Levels
Output Load
3-state levels are measured 0.5V from
steady-state active level.
1.5V
1.5V
See Figure 2
Table 2-0003/2064V
Output Load Conditions (see Figure 2)
TEST CONDITION
A
R1
R2
CL
31634835pF
S Device
N Output
R1
Test
Point
R2
CL*
DESIG *CL includes Test Fixture and Probe Capacitance.
0213A/2064V
Active High
B
Active Low
W Active High to Z
E C
at VOH -0.5V
Active Low to Z
N at VOL+0.5V
316
348
348
348
35pF
35pF
5pF
316
3485pF
Table 2-0004/2064V
OR DC Electrical Characteristics
F Over Recommended Operating Conditions
SYMBOL
PARAMETER
CONDITION
MIN. TYP.3 MAX. UNITS
E VOL
Output Low Voltage
IOL= 8 mA
0.4
V
V VOH
64 IIL
0 IIH
I 2 IIL-isp
S IIL-PU
L IOS1
Output High Voltage
Input or I/O Low Leakage Current
Input or I/O High Leakage Current
ispEN Input Low Leakage Current
I/O Active Pull-Up Current
Output Short Circuit Current
IOH = -4 mA
0V VIN VIL (Max.)
(VCC 0.2)V VIN VCC
VCC VIN 5.25V
0V VIN VIL
0V VIN VIL
VCC= 3.3V, VOUT= 0.5V
2.4
V
-10 µA
10
µA
50 mA
-150 µA
-150 µA
-100 mA
p ICC2, 4 Operating Power Supply Current
VIL= 0.0V, VIH = 3.0V
fCLOCK = 1 MHz
82
mA
is 1. One output at a time for a maximum duration of one second. VOUT = 0.5V was selected to avoid test
problems by tester ground degradation. Characterized but not 100% tested.
Table 2-0007/2064V
E 2. Measured using four 16-bit counters.
3. Typical values are at VCC= 3.3V and TA= 25°C.
S 4. Maximum ICC varies widely with specific device configuration and operating frequency. Refer to the Power Consumption
Usection of this data sheet and Thermal Management section of the Lattice Semiconductor Data Book or CD-ROM to
estimate maximum ICC .
4

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